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  • 11
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 3002-3007 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic stray fields of Co-Cr microstrips are investigated for bit stabilization in a vertical Bloch line memory (VBLM). The stray fields were revealed using Lorentz force based Foucault and differential phase contrast (DPC) techniques in a transmission electron microscope. The assumed shape of the stray fields for VBLM use has been experimentally verified. Agreement between experiment and simulation is obtained.
    Type of Medium: Electronic Resource
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  • 12
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 5554-5562 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Transmission electron microscopy is used to provide a detailed description of how magnetization reversals take place in NiFe/Cu/NiFe/FeMn spin-valves. Direct observation is made of how both NiFe layers respond to an applied field. Marked differences from the behavior observed in single Permalloy layers of the same thickness are identified. Complex 360° wall structures frequently form and are studied in some detail. A description of their structure is given and a theory involving the compensation of charges from the biased layer is suggested to explain stability. The work has a direct bearing on the performance of spin-valves as sensors as the way the magnetization changes under the influence of an applied field affects the noise characteristics. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 13
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 5349-5355 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A method for imaging magnetic domain structures in the transmission electron microscope is described. Coherent Foucault imaging provides a direct means of producing a magnetic interferogram which reveals the quantitative distribution of magnetic induction across the specimen. The technique requires the high coherence of a field-emission gun system and the ability to position an aperture accurately to cut part of the diffraction pattern. A simple analytical theory, together with computer simulations and experimental results, is presented to demonstrate the power of the technique.
    Type of Medium: Electronic Resource
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  • 14
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic domain structure and microscopic magnetization reversal processes in epitaxial Fe/GaAs(001) films with cubic anisotropy and in-plane easy axes have been investigated by a Lorentz microscope equipped with a magnetizing stage. For the films of a few hundred angstroms thickness we observe the single domain remanent state predicted for a two-dimensional film but find that domains play a crucial role in the magnetic reversal process. For reversal along the in-plane 〈110〉 directions (hard axes), magnetization reversal proceeds via a combination of coherent rotation and displacements of weakly pinned 90° domain walls at critical fields. For magnetization reversal along the in-plane 〈100〉 directions (easy axes), an irregular checkerboard domain structure develops at the critical field and both 180° and 90° domain walls coexist. The reversal of the domains with magnetization vector opposite to the applied field direction takes place by a combination of two 90° reorientations. We discuss how these processes are related to the magnetic anisotropies present in the film and the macroscopic M-H hysteresis curves.
    Type of Medium: Electronic Resource
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  • 15
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic structures which occur in (Co/Ni81Fe19/Co)/Cu multilayer films showing giant magnetoresistance have been investigated using electron microscopy. Rather similar fine domains, with sub-μm dimensions, were found in films comprising 14 and 6 magnetic layers. Whilst the observed structure depended greatly on the magnetic history of the sample, a combination of differential phase contrast imaging and low angle diffraction allowed an estimate to be made of the extent to which neighboring magnetic layers were aligned antiparallel to each other. For both samples typically two layers were found to have parallel alignment leading to the possibility that departures from the expected antiferromagnetic behavior are more prevalent at the surfaces rather than in the bulk of the multilayer.
    Type of Medium: Electronic Resource
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  • 16
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 2913-2919 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The stray field, magnetic microstructure, and switching behavior of high-resolution electron beam fabricated thin film tips for magnetic force microscopy (MFM) are investigated with different imaging modes in a transmission electron microscope (TEM). As the tiny smooth carbon needles covered with a thermally evaporated magnetic thin film are transparent to the electron energies used in these TEMs it is possible to observe both the external stray field emanating from the tips as well as their internal domain structure. The experiments confirm the basic features of electron beam fabricated thin film tips concluded from various MFM observations using these tips. Only a weak but highly concentrated stray field is observed emanating from the immediate apex region of the tip, consistent with their capability for high resolution. It also supports the negligible perturbation of the magnetization sample due to the tip stray field observed in MFM experiments. Investigation of the magnetization distributions within the tips, as well as preliminary magnetizing experiments, confirm a preferred single domain state of the high aspect ratio tips. To exclude artefacts of the observation techniques both nonmagnetic tips and those supporting different magnetization states are used for comparison. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 17
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6452-6454 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetization reversal processes in the free and the pinned layers of TbCo-biased spin valves have been studied in a highly modified transmission electron microscope. Reversal of the free layer in the presence of a field antiparallel to the biasing direction proceeds by a complex domain process with 360° walls forming frequently. In the presence of substantially higher fields, the pinned layer reverses by creep of highly irregular walls through the structure. By studying image grey levels, an estimate of the average orientation of the induction vector in the TbCo layer is made. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 18
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The understanding of the magnetization processes in Co/Cu multilayers showing substantial giant magnetoresistance (GMR) is incomplete. To gain further insight into the coupling and resultant switching characteristics, a series of Co/Cu multilayers with 3–15 bilayers has been grown by dc magnetron sputtering. Microstructural and micromagnetic studies along with MR measurements were made on the samples. Lorentz microscopy was used to directly observe the evolution of domain structures under the influence of an applied field. It appeared that dissimilar domain structures occurred in different layers. Magnetic structures were generally submicron in size although in samples with few bilayers well defined domain walls were also observed during the reversal process. Their occurrence coincided with abrupt steps in the GMR curves. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 19
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 5321-5325 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Simple calculations suggest that when continuous films of spin-valve material are patterned into micron-sized elements the magnetic properties should change markedly, depending on the element shape and size. We have used the differential phase contrast imaging mode of transmission electron microscopy to study directly the magnetization distributions supported by such elements in zero field and when subjected to an applied field in the pinning direction. For elements whose long axis is parallel to the pinning direction a parallel alignment of the free and pinned layers is favored. When subjected to a field a complex domain structure evolves and different irreversible paths are followed as the element is taken from negative to positive saturation and back again. By contrast, when the pinning direction is parallel to the short axis an antiparallel arrangement, where the magnetostatic contribution to the energy is effectively suppressed, can be preferred and simpler reversal mechanisms, with a higher degree of reversibility, are frequently seen. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 20
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 2760-2765 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron beam lithography and reactive ion etching have been used to pattern micron-size magnetic elements in the free layer of spin–tunnel junctions. The magnetization reversal processes of elements with dimensions in the range from 15×1 μm2 to 1×1 μm2 have been studied using Lorentz microscopy in the transmission electron microscope. Under the application of a field parallel to the bias direction, elongated elements reverse by the growth and subsequent annihilation of a quasiperiodic domain structure which evolves from the ends of the elements. Similar processes occur in both halves of a magnetization cycle. By contrast, the reversal of square elements involves the formation of more complex domain structures which differ significantly according to the direction in which the field in applied. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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