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  • 1
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Particle Beam Fusion Accelerator II is a light-ion fusion accelerator that is presently capable of irradiating a 6-mm-diam sphere with ∼50 kJ of 5.5-MeV protons in ∼15 ns. An array of particle and x-ray diagnostics fielded on proton Inertial Confinement Fusion target experiments quantifies the incident particle beam and the subsequent target response. An overview of the ion and target diagnostic setup and capabilities will be given in the context of recent proton beam experiments aimed at studying soft x-ray emission from foam-filled targets and the hydrodynamic response of exploding-pusher targets. Ion beam diagnostics indicate ∼100 kJ of proton beam energy incident within a 1.2-cm radius of the center of the diode with an azimuthal uniformity which varied between 6% and 29%. Foam-filled target temperatures of 35 eV and closure velocities of 4 cm/μs were measured.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 8783-8791 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The performance of high-temperature superconducting gradiometers have been evaluated in fields of up to 70 μT to determine their limitations in unshielded environments. The sensors incorporate first-order gradiometric superconducting quantum interference devices (SQUIDs) coupled to first-order gradiometric flux transformers. A gradiometer was operated successfully at all angles with respect to an ambient field with less than 20% variation in critical current and voltage/flux ratio. Magnetic hysteresis at 77 K was measured for field excursions up to 70 μT. The hysteresis factor, referred to the SQUID, averaged 10−3 Φ0/μT. Flux movement in the SQUID washers rather than the flux transformer was found to be the dominant cause of the hysteresis and the presence of the flux transformer reduced the hysteresis. This is interpreted as due to the coupling coil pinning the vortices against radial motion. The spectral noise density of the gradiometer was only weakly dependent on the orientation with respect to static fields of up to 70 μT except for narrow angular ranges where dominating random telegraph signal processes occurred. In contrast, field cooling the gradiometer above 15 μT was found to substantially increase the low-frequency noise. A gradiometer was successfully transported and operated out of doors with no shielding. Only a relatively minor degradation of performance was observed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2016-2018 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial thin films of YBa2Cu3O7 have been grown in situ by evaporation onto (001) MgO substrates. The composition was varied systematically to investigate the effects of changes in Cu content and Ba/Y ratio on the film properties. The results demonstrate that deviations from stoichiometry at the limit of resolution of most analytic techniques can have a large effect on structural and transport properties, as well as causing marked changes in surface morphology. The best properties (Jc(approximately-greater-than)3×106 A/cm2 at 77 K) are only found for a narrow range of compositions, which can be readily identified from the surface morphology.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 51 (1987), S. 502-504 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electrolyte electroreflectance measurements in ethanol/lithium perchlorate solutions over the temperature range 300–156 K have been used to derive the temperature dependence of the E1 transition of Hg1−xCdxTe (x=0.23–0.36). The temperature coefficient dE1/dT derived by third derivative line-shape fitting (6.6±0.5×10−4 eV K−1) is considerably higher than values reported previously in the literature.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 75-77 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The use of cw laser ablation for defining narrow tracks in YBa2Cu3O7 thin films on (001) SrTiO3 substrates is described. Critical current densities have been observed up to 5×105 A/cm2 in 4-μm-wide tracks at 77 K. For these films, it is found that the value of critical current density calculated is insensitive to the length of track and the voltage criterion used.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 2137-2145 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present coplanar resonator measurements of the nonlinear microwave surface impedance of laser ablated and electron-beam coevaporated YBa2Cu3O7−δ thin films at 8 GHz in zero and applied magnetic fields, including the effects of irradiation with heavy ions. Correlations between the changes in surface resistance and reactance as a function of microwave current suggest that there are different contributions to the nonlinear behavior at low and high microwave currents in both zero and applied fields. In zero field, we suggest that microwave-induced flux lines are responsible for the observed nonlinear behavior, resulting in thermal runaway at large, sample dependent, microwave currents. The observed nonlinearity completely masks any possible contribution from the intrinsic pair breaking expected for a d-wave superconductor. In a magnetic field at relatively low currents, the nonlinearity can be described by the nonlinear dynamics of flux lines pinned by defects with a continuous range of pinning strengths. At higher currents, microwave field nucleation of flux lines is again considered important. On irradiation with 3.6 MeV/nucleon Xe-129 ions, the microwave losses and nonlinearity are significantly decreased in both zero and applied fields, which could have important implications for microwave device applications. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 4518-4522 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used the technique of electrolyte electroreflectance (EER) coupled with electrochemical etching to profile through epitaxial layers and heterostructures of Hg1−xCdxTe. The need for proper electrochemical control during EER measurements is discussed. The resolution achieved in both composition, Δx=±0.002, and etch depth, ±30 A(ring), has made possible the observation of the variations in composition at the ambient/epilayer, epilayer/substrate, and high-x/low-x interfaces. Good correlations of the profiles observed have been obtained with secondary ion mass spectroscopy, electron dispersive x-ray diffraction, and Rutherford backscattering measurements. The variation of the broadening parameter Γ at these interfaces is also discussed.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 61 (1992), S. 228-230 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In the processing of high temperature superconductor thin films into devices, the use of calibrated milling rates has proved unreliable as a means of determining the milled depth. This problem has been solved using in situ secondary ion mass spectrometry for identifying interfaces in multilayers based on YBa2Cu3O7. The depth resolution obtained during routine patterning of typical multilayers was ∼4 nm. Accurate termination of milling at an insulator/superconductor interface has been demonstrated. The presence of water vapor during milling has been shown to affect the proportions of the different secondary ion species, but has only a slight affect on the milling rate.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 1516-1518 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A low-temperature argon ion milling process has been used to induce growth of c-oriented YBa2Cu3O7 on (001) MgO substrates with the in-plane film axes rotated 45° with respect to those of the substrate, and with respect to those of films grown on untreated regions of the substrate. This process is compatible with standard photolithographic processing, and has been used to produce defined areas of the two orientations on the same substrate. Josephson junctions and dc SQUIDs have been fabricated using the resulting grain boundaries.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 918-920 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Current flow in YBa2Cu3O7/PrBa2Cu3O7 multilayer structures has been studied using low temperature, scanning electron microscope, beam-induced voltage contrast. Specialized data acquisition has been used to limit thermalization effects and improve resolution. For both via hole contacts and crossovers, the lowest critical current densities were found at steps where the superconductor tracks climb up or down over patterned edges of the insulator.
    Type of Medium: Electronic Resource
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