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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The microstructure and electrical properties of nonalloyed epitaxial Au-Ge contacts were studied. Ohmic behavior was obtained after a 3 h anneal at 320 °C with the lowest average contact resistance and specific contact resistivity found to be ∼0.28 Ω mm and ∼7×10−6 Ω cm2, respectively. Localized reactions in the form of islands were observed across the surface of the contact after annealing and were composed of Au, Ge, and As, as determined by secondary ion mass spectroscopy (SIMS) imaging and Auger depth profiling. Back side SIMS profiles indicate deep Ge and Au diffusion into the GaAs substrate in the island regions. Ohmic contact behavior was found to depend upon both the kinetics of the reactions (localized reactions and island growth) and the thermodynamics (substantial diffusion of both Au and Ge) of the system. A model describing the coupled Au and Ge in-diffusion with respect to the GaAs substrate is presented.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 4816-4819 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A study of chemical etching and chemo-mechanical polishing of Hg0.8Cd0.2Te (MCT) with bromine-methanol has been carried out. It was found that the etch rate could be controlled down to 0.1 nm/s when 0.001% of bromine-methanol was used. Surface analysis using x-ray photoelectron spectroscopy indicated that differential etching of the constituents and accumulation of elemental tellurium occurred even when only a few monolayers were etched from a stoichiometric MCT surface. The relative etch rates were determined to be Cd(very-much-greater-than) Hg(approximately-greater-than)Te. Nevertheless, it was found that chemo-mechanical polishing could produce smooth surfaces with no significant accumulation of elemental tellurium. The production of such surfaces, however, required a balance of chemical etching and mechanical lapping. Furthermore, quick quenching of chemical etching was also required after chemo-mechanical polishing in order to prevent further surface degradation.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5621-5624 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Raman spectroscopy has been used to characterize anodic films grown on n-Hg0.8Cd0.2Te from alkaline media. The spectral results, when compared with those from several reference chemicals, provide unambiguous identification of the anodic film as a 1:1 mixture of amorphous cadmium and mercury tellurites. Since the anodic film is transparent to visible light, Raman spectroscopy was also used to probe nondestructively the substrate surface under the film. The results indicate that the substrate surface was depleted in cadmium.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 4399-4402 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present the scanning electron-filling modulation reflectance (SEFR) of charged In0.5Ga0.5As self-assembled quantum dots. The SEFR is performed by applying a small constant modulation voltage and scanning the dc bias through the quantum dot energy levels. The spectral intensity of the SEFR can be related to the electron density confined in each quantum state, which shows a good agreement with the apparent carrier concentration deduced from the capacitance–voltage measurements. In this study, we find that the transition energy of quantum-dot excited state is about 10 meV smaller than the values obtained from the photoluminescence and electron-filling modulation reflectance. This phenomenon is explained by the Coulomb interactions between the optical excited electron–hole pair and the electrons occupied in the quantum dots. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 4731-4736 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A long-wavelength λc=18 μm infrared hot-electron transistor (IHET) with low dark current is demonstrated. In order to achieve long-wavelength absorption, a low barrier height is required, which in turn results in a large dark current. Therefore, operation of a normal long-wavelength quantum-well infrared photodetector (QWIP) structure is limited to very low temperatures and biases due to the thermally activated dark current. In the IHET, a high-energy pass filter placed after 30 periods of GaAs/AlGaAs quantum wells blocks the temperature-activated dark current while allowing high-energy photoexcited electrons to pass and be collected as photocurrent. A comparison of the dark current to the 300 K background photocurrent shows that the QWIP structure without the high-energy pass filter demonstrates background-limited infrared photodetection (BLIP) only at T≤35 K. Furthermore, in order to avoid saturating a typical readout circuit, detector operation of the QWIP is restricted to biases less than 0.08 V at 35 K. In contrast, the filtered dark current in the IHET is reduced by two to four orders of magnitude such that BLIP performance can be achieved for temperatures up to T=55 K without saturating the readout circuit. Because of the preferential current filtering effect, the noise equivalent temperature difference of the IHET can be improved by a factor of 100 at T=55 K. The dark-current-limited detectivity was found to be D*=1×1010 cm Hz1/2/W at λp=15 μm, Ve=−0.2 V, and T=55 K.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 3092-3097 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Effects of 35Cl+ bombardment of Si (100) surfaces were studied with a mass-separated low energy ion beam system operated under ultrahigh vacuum and with in situ x-ray photoelectron spectroscopy (XPS). Before ion bombardment, each silicon sample was etched with a hydrofluoric acid solution and rinsed in deionized water. XPS showed that the surface received no ion bombardment was effectively hydrogen passivated and had no silicon with an oxidation number higher than 2. However, oxygen was found which was probably present in the form of Si—OH or adsorbed water. Chlorine ion bombardment at room temperature initially drove the surface oxygen to the formation of silicon oxide which was subsequently etched off by further ion bombardment. The surface oxidation was initiated by the formation of Si—Cl bonds followed by the thermodynamically favorable replacement of Si—Cl with Si—O. The removal of the surface oxygen depended critically on the bombardment energy. At a bombardment energy of 1±0.6 eV, oxygen bonding was still observed even with a dose of 1018/cm2. The critical dose for oxygen depletion was found to be about 1×1018/cm2 for 40 eV bombardment, and about 1×1016/cm2 for 100 eV bombardment. Physical sputtering was the main oxide removal mechanism. Once the surface oxygen atoms were consumed, the silicon surface was etched by the chlorine ions with an enhancement by the chlorine chemistry. However, the absence of Si—Clx (x(approximately-greater-than)1) was clearly shown by XPS. Hence, bombardment must have promoted the desorption of the surface silicon chlorides.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 72 (1998), S. 7-9 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A quantum-well infrared photodetector (QWIP) based on the corrugated light-coupling scheme has been fabricated and tested for remote temperature sensing. The QWIP consists of two stacks of multiple quantum wells (MQWs), each sensitive in one of the atmospheric infrared transmission windows and each with a separate readout circuit. High optical coupling efficiency is obtained in both wavelength ranges, demonstrating the use of the corrugated structure for two-color detection. By monitoring the ratio of the photocurrent generated simultaneously in each MQW stack, the temperature of the object emitting the radiation can be determined, regardless of its emissivity and the geometrical factors. This temperature sensing ability is tested by using a blackbody radiator with precision temperature control as the target. The agreement between the measured and the preset temperatures indicates that the corrugated QWIP is capable of precision thermometric measurements. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 1074-1080 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Franz–Keldysh oscillations in Si-δ-doped GaAs have been studied by the application of fast Fourier transformations to the piezoreflectance spectra. In such studies, we find that the Franz–Keldysh oscillations of the piezoreflectance and its associated Fourier transformation can be described by a model calculation which considers the energy gap modulation in a uniform electric field. Owing to the character of nonelectromodulation, the Franz–Keldysh oscillation lineshape in the piezoreflectance has no modulation electric field distortion such as that which occurs in the photoreflectance and electroreflectance experiments. We demonstrate that the piezoreflectance accuracy is better than the photoreflectance or electroreflectance for the measurement of a uniform built-in electric field. The fast Fourier transformation of piezoreflectance spectra exhibits two separate heavy- and light-hole frequencies at temperatures from 20 to 425 K. Using these separated peaks, the ratio between the heavy- and light-hole effective reduced mass, the surface Fermi level, and the broadening parameters of the Franz–Keldysh oscillations are measured and discussed. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2118-2120 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Franz–Keldysh oscillations from GaAs and AlGaAs structures have been studied and we find that the electric field obtained from the oscillations is in agreement with that derived from electrostatic calculations. Our results show that illumination from pump and probe beams in a normal photoreflectance experiment can significantly affect the measurement and thus erroneously lead to a reduced value of the electric field. The Fermi level on the bare surface of AlGaAs with different Al mole fraction has also been determined.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 7873-7878 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The line shapes of electromodulation spectra exhibit extended Franz–Keldysh oscillations and interference beats in the presence of a uniform built-in electric field. For this work, we used photoreflectance and contactless electroreflectance to study the Franz–Keldysh oscillations in Si-delta-doped GaAs. The fast Fourier transformation taken to the photoreflectance and contactless electroreflectance spectra, produced more complicated results than were observed in previous studies, when the effect of the modulation field is nonnegligible. This indicates that the interference beats are not only due to different effective heavy-hole and light-hole mass but also to the modulation field. We propose that the Franz–Keldysh oscillations generally contain four frequencies, which correspond to the heavy-hole and light-hole splitting. A comparison between the experiments and some numerical simulations attest to the validity of our proposal. This line shape analysis could then be applied to estimate the strength of a modulation field in contactless electroreflectance and photoreflectance. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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