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  • 1
    Electronic Resource
    Electronic Resource
    Micro x-ray diffraction technique for analysis of the local layer structure in the ferroelectric liquid crystal : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 1373-1375 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A hard x-ray microprobe has been developed for small-angle x-ray diffraction studies. The x-ray microprobe system consists of a multilayer monochromator in combination with x-ray focusing mirrors (Kirkpatrick–Baez type) and achieves both high spatial resolution (5×5 μm at the sample) and high angular resolution (about 0.6 and 0.2 mrad in horizontal and vertical directions, respectively). The local layer structure of the surface stabilized ferroelectric liquid crystals was determined, for the first time, directly with this arrangement. Advantages of x-ray microbeam topography are also discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145979
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  • 2
    Electronic Resource
    Electronic Resource
    A newly developed multilayer semiconductor x-ray detector for the observations of wide energy-range x rays : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2311-2313 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: For the purpose of the developments of wide-energy-range-sensitive x-ray detectors, we have designed and fabricated a new-type multilayer semiconductor x-ray detector. This new-type detector has been characterized using synchrotron radiation from a 2.5-GeV positron storage ring at the Photon Factory of the National Laboratory for High Energy Physics (KEK). This new detector is essentially composed of four layers of commercially available photodiodes. Each photodiode is made from a 300-μm thick, and a 10×10-mm square-shaped wafer. For the common affiliation of these individual photodiodes, the quantum efficiency normalized by the photon energy η/E begins to decrease at 8 keV, and then η/E decreases down to 26% at 20 keV. On the other hand, for our newly designed detector a flat response even in the 10–20-keV energy regime (beam line 15C at the Photon Factory) is observed, and even at 100 keV η/E〈30% is still anticipated. This new x-ray detector has various advantages: (i) A compact, and (ii) outgas-free detector for a high-vacuum use, along with (iii) a high degree of immunity to ambient magnetic fields. Furthermore, (iv) the combination of the x-ray signal outputs from each detector layer provides information on the x-ray emitting electron energies. These properties are quite suitable for the use of the fusion-oriented plasma x-ray diagnostics under intense-magnetic field and high-vacuum conditions so as to interpret wide-band x-ray emitting electron-velocity distribution functions from the x-ray data. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145673
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  • 3
    Electronic Resource
    Electronic Resource
    Experimental verification of the three-dimensional diffusion effect of x-ray-produced charges in semiconductor x-ray detectors on the quantum-efficiency enhancement : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2300-2302 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: One of the characteristic physical principles of our recently proposed theory on the x-ray-energy response of a semiconductor x-ray detector is the effect of the three-dimensional diffusion of x-ray-produced charges in a semiconductor field-free substrate region. It is found and reported that the quantum efficiency of a semiconductor x-ray detector is enhanced when this phenomenon is taken into account, and the data on the x-ray-energy response of the semiconductor detector using monochromatized synchrotron radiation at the Photon Factory are actually well fitted by the theory. In addition, we measure the diffusion length L of the detector using a precisely collimated x-ray narrow beam and a multichannel detector array setting on a μm-order position-controllable stage. The verification of the consistency between this observed value of L and the predicted value of L from our theory on the quantum efficiency, has been achieved. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145669
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  • 4
    Electronic Resource
    Electronic Resource
    Development and characterization of silicon semiconductor x-ray detectors for plasma diagnostics : Proceedings of the tenth topical conference on high temperature plasma diagnostics (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 543-545 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The x-ray energy responses of silicon semiconductor detectors, including surface-barrier and photodiode-type detectors, have been investigated, using synchrotron radiation from a 2.5 GeV positron storage ring at the Photon Factory (KEK) in order to study the fundamental physics mechanism of the output signals. These studies are essential to obtain the principles of the future designs of plasma x-ray detectors, as well as of their plasma data analyses. The characterization experiments and their physics interpretations were made using (i) a group of fully depleted detectors and (ii) another group of partially depleted detectors characterized by obviously different depletion-layer thicknesses and minority-carrier diffusion lengths, but with the same wafer thickness. Both results are well interpreted by our newly proposed formula for a semiconductor x-ray-detector response. The importance of these investigations for the plasma x-ray diagnostics is highlighted by significant errors for the estimation of plasma-electron temperatures when the commonly utilized conventional theory is employed for the plasma data analyses. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146346
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  • 5
    Electronic Resource
    Electronic Resource
    Imaging Bragg spectrometer for pinched plasma experiments (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 3761-3765 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A compact Bragg spectrometer for monochromatic imaging in the soft x-ray region was designed and examined. With this spectrometer, a pinhole image is simultaneously recorded with a monochromatic image. This makes it possible to easily identify the wavelength when the location of the soft x-ray source fluctuates from shot to shot, such as in the plasma focus and Z-pinch plasma. An rubidium acid phtalate (RAP) flat crystal was examined and monochromatic images of the argon K lines around 4 A(ring) were successfully obtained and displayed. The resolution power and dispersion obtained in situ were compared with the calculated values. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144503
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  • 6
    Electronic Resource
    Electronic Resource
    X-ray polarization-contrast imaging of crystals (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 3365-3369 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new technique of x-ray polarization-contrast imaging to characterize crystals is described. The polarization-contrast imaging visualizes birefringent properties of a crystal. The contrast formation mechanism is explained by the dynamical theory of x-ray diffraction. The novel x-ray optics using synchrotron radiation are proposed, and the first x-ray polarization-contrast images of a crystal are reported. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.361418
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  • 7
    Electronic Resource
    Electronic Resource
    Performance of an imaging plate as an x-ray area detector used for plane-wave x-ray diffraction topography (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 4487-4491 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We report the linearity, spatial resolution, and granularity of x-ray intensity images recorded on imaging plates (IPs). The IP-processing system, designed for use with a transmission electron microscope (TEM), was used to evaluate the influence of these characteristics on profiles of local lattice distortion in silicon obtained by plane-wave x-ray diffraction topography (PWT). The signal intensity was linear with x-ray doses over four orders of magnitude of intensity, as has also been reported in the case of TEM. The modulation transfer function and root mean square of x-ray intensity images were measured to evaluate the spatial resolution and granularity. The results indicate that profiles of lattice distortion with a period of more than 0.5 mm can be reproduced by PWT in combination with the present IP-processing system. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1146420
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  • 8
    Electronic Resource
    Electronic Resource
    Manipulation of single coiled DNA molecules by laser clustering of microparticles (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 515-517 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have developed a method of manipulating single DNA molecules for application in single-molecule analysis. Using a bead cluster formed by laser trapping, the technique allows single DNA molecules to be manipulated at any point on the molecule without the need for prior chemical modification as in DNA-bead complex techniques. We describe the method and the characteristics of cluster formation, and present examples of actual DNA molecule manipulation. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1435803
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  • 9
    Electronic Resource
    Electronic Resource
    Field Ion Studies of Structure of GP Zones (1988)
    Palo Alto, Calif. : Annual Reviews
    Annual Review of Materials Research 18 (1988), S. 351-380 
    Details
    ISSN: 0084-6600
    Source: Annual Reviews Electronic Back Volume Collection 1932-2001ff
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1146/annurev.ms.18.080188.002031
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  • 10
    Electronic Resource
    Electronic Resource
    Increases in collagen type I synthesis in asthma: the role of eosinophils and transforming growth factor-bβ (2002)
    Oxford, UK : Blackwell Science Ltd
    Clinical & experimental allergy 32 (2002), S. 0 
    Details
    ISSN: 1365-2222
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: Background Collagen type I is one of the major deposits in thickening of the reticular basement membrane of asthma.Objective and Methods In this study, we assessed turnover of collagen type I in asthma by measuring procollagen type I C-terminal peptide (PICP) and collagen type I C-terminal telopeptide (ICTP) in induced sputum.Results PICP but not ICTP was found to be significantly higher in asthma subjects than in normal volunteers (P 〈 0.05). In asthma, PICP was inversely correlated with %FEV1.0 (r = −0.539), and its levels significantly increased upon exacerbation (P 〈 0.05), indicating that collagen synthesis increases during asthma exacerbation. Additionally, PICP was found to significantly correlate with eosinophil counts in sputum (r = 0.539), indicating that eosinophils stimulate collagen turnover. Because eosinophils can produce TGF-β, a potent stimulator of collagen synthesis, we immunocytochemically examined TGF-β-positive cells in sputum. TGF-β-positive cells significantly correlated with eosinophil counts (r = 0.811) and PICP (r = 0.569), suggesting that TGF-β released from eosinophils is involved in collagen synthesis.Conclusions The results of the present study suggest that collagen synthesis is stimulated in asthmatic airways by eosinophils through TGF-β, while collagen degradation is not, and that PICP in sputum can act as a new marker for airway inflammation in asthma.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1046/j.1365-2745.2002.01404.x
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