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  • 1
    ISSN: 0040-6090
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 0040-6090
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1432-1130
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Gas chromatography and high-performance liquid chromatography coupled to a double focusing sectorfield ICP-MS as sensitive element specific detector are used for the speciation of arsenic of liquid and gaseous emissions from soil samples, which were equilibrated in a microcosmos experiment. Speciation of liquid samples was performed by HPLC and hydride generation was used as introduction system to ICP-MS. An online prereduction step was introduced to enhance the sensitivity for As(V). A home-built and laboratory-ready transfer line from GC to ICP-MS is presented and quantification of As in gaseous emissions was performed by external calibration via hydride generation. The microcosmos experiment revealed only low production rates of organoarsenic compounds and reflected a limited capability of the biovolatilization experiment for the simulation of natural systems.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' journal of analytical chemistry 368 (2000), S. 148-155 
    ISSN: 1432-1130
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The performance of four commercially available ICPMS instruments of three different types was compared by means of uranium “isotopic measurements”. Examined were two quadrupole sector (different generation, different manufacturer), one single detector double focusing magnetic sector and one multiple collector double focusing magnetic sector instruments. The same samples of the IRMM-072 series were used under routine conditions to measure the 233U/235U and the 233U/238U ratios which, in these samples, vary over almost three orders of magnitude from ∼ 1 to ∼ 2 · 10–3. Within expanded (k = 2) uncertainties, good agreement was observed between the certified values and the data internally corrected for mass-discrimination effects. The magnitude of the evaluated uncertainties was different for each type of instrument. With the multiple collector instrument, expanded uncertainties varied from ± 0.04% to± 0.24% for the 233U/235U ratio, and from ± 0.08% to ± 0.27% for the 233U/238U ratio. They were ∼ 1 to 5 times larger with the single detector magnetic sector instrument, and ∼ 10 to 25 times larger with both quadrupole sector instruments. With the multiple collector instrument, repeatability of the measurements seemed to be limited by the difficulty of correcting properly for instrumental background, whereas with the single detector magnetic sector instrument the counting statistics was the only limitation (on smallest ratios). Apparent mass-discrimination was clearly found to be larger but more reproducible (and hence easier to correct for) in the case of magnetic sector instruments than for both quadrupole sector instruments. If space charge effects were the main source of mass-discrimination for all instruments, these results are in contradiction with the hypothesis of the size of mass-discrimination decreasing with the acceleration voltage. With the single detector magnetic sector instrument in particular (when operated by changing the ion energy only), our results pointed at more than only one major source of mass-discrimination, with variable size depending on the ratios measured.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' Zeitschrift für analytische Chemie 349 (1994), S. 190-194 
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract In-situ AFM images have been produced of dissolution processes on NaCl and KBr single crystals under different organic solvents. Using a home-built sample holder stable imaging conditions have been achieved and atomic resolution could be obtained on both materials. Dissolution rates have been determined quantitatively from the AFM images and compared with empirical solvent parameters such as acceptor number AN and ET(30) value. The AFM results are in agreement with the expected behaviour of the liquids. Dissolution rates could be controlled using mixtures of polar and non polar solvents. The results are a basis for further investigations of other systems and technologically important processes such as corrosion and surface modification.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' Zeitschrift für analytische Chemie 351 (1995), S. 143-147 
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The Maximum Entropy Method (MEM) has been applied successfully to the deconvolution of images obtained by Atomic Force (AFM) and Scanning Tunneling Microscopy (STM) using a NanoScope III system. The images have been taken on graphite (STM) and NaCl (AFM) substrates. Image processing has been performed running the Cambridge MaxEnt Fortran 77 library MEMSYS-5 on an IBM RISC 6000/360. Among the possible hypotheses the optimal solution was selected using the standard entropy method. ICF and response function have been generated artificially to fit the correlation of physical structures for atomically resolved images. Comparison of MEM and FFT revealed, that the main advantage of MEM is its ability to reproduce atomic defects on regular structures, whereas FFT deconvolution tends to eliminate these perturbations.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of porous materials 7 (2000), S. 349-352 
    ISSN: 1573-4854
    Keywords: porous silicon morphology ; nanometric roughness ; pore size measurement
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The morphology of porous silicon (PS) formed by wet etching of Si crystals in fluoride solutions was investigated by atomic force microscopy (AFM). The experiments were made in a liquid cell to allow the measurements to be made before the drying process caused restructuring of the surface porosity. We studied the surface roughness, showing experimentally that PS samples produced in high HF concentrations are smoother than PS samples produced in low HF concentrations. We also demonstrated that using the capillary forces produced by the AFM probe tip itself, it is possible to etch layers of the PS material, opening “windows” to observe the interior PS layers. We identified through Fourier transform analysis the most frequent dimensions of the pores, concluding that these pores in general do not suffer appreciable vertical narrowing and that high HF concentrations are favorable for the formation of more pores of smaller size.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The growth of ZnS thin films on a mica substrate in a Successive Ionic Layer Adsorption and Reaction (SILAR) process has been studied. The films were deposited in-situ using the commercial AFM liquid cell as flow-through reactor. Reactants and rinsing water were exchanged in the cell continuously by a computer controlled valve system. In this way the film growth could be observed directly in a time resolved sequence of images taken after 1 up to 100 cycles. The results show that the stability of the films increases between 1 and 30 cycles and that a full coverage of the surface is reached after approximately 50 cycles.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract In-situ observations of surface processes on a freshly cleaved multiquantum well (MQW) cleavage edge allow to obtain chemical information in addition to the surface topography primarily seen in AFM images. Under air the cleavage surface shows a corrugation of about 0.5 nm due to a varying degree of oxidation on the different layers. This oxidation process could be avoided by preparing and imaging the cleavage surface under inert toluene without any contact to ambient atmosphere. After removing the toluene and purging the cell with air, oxidation products developed along the expected AlGaAs layers. A treatment of the oxidized surface with 1 and 10 mmol/L HCl has led to crater formation, which was more pronounced in areas of chemical inhomogeneities and crystallographic defects. 0.1 mol/L HCl has led to an inversion of the original contrast over the whole investigated area, which could be monitored directly in the AFM liquid cell.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Springer
    Fresenius' Zeitschrift für analytische Chemie 353 (1995), S. 666-669 
    ISSN: 1618-2650
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Corrosion phenomena on surfaces of potash-lime-silica glass with medieval composition have been imaged in-situ using AFM in combination with a home built sample holder and a commercial liquid cell. Measurements under ambient atmosphere lead to pit corrosion. Sample preparation and measurement performed under liquids such as isobutanol inhibit the corrosion process. Addition of water (10 vol%) induces the formation of a leached layer, where the network modifiers such as K and Ca are exchanged by hydrogen-bearing species. During the measurements interactions of the tip with the sample surface have been observed.
    Type of Medium: Electronic Resource
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