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1

Digitale Medien

Zn drops at a Si surface measured by the refracted x-ray fluorescence method (1991)

Sasaki, Y. C. ; Kisimoto, M. ; Nagata, S. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Journal of Applied Physics 69 (1991), S. 8420-8422

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ISSN: 1089-7550

Quelle: AIP Digital Archive

Thema: Physik

Notizen: Si and Zn are essentially mutually insoluble. We were able to detect Zn drops at a Si surface by using the refracted x-ray fluorescence method when the Si wafer was implanted with Zn ions at 50 keV up to doses of 1 × 1016 cm−2. The presence of the Zn drops at the Si surface was confirmed both by measuring surface roughness and Rutherford-backscattering spectroscopy spectra.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.347411

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2

Digitale Medien

Observation of x-ray sheet beam from radioisotopes embedded in thin-film waveguide (1995)

Sasaki, Y. C. ; Tomioka, Y. ; Satoh, I.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 67 (1995), S. 164-166

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: A specific angular distribution of x rays from 111In embedded in a thin-film waveguide (Au film/Langmuir–Blodgett film/Au substrate) is observed by a non-energy-dispersive two-dimensional detector (imaging plate). The angular distribution for the thickness of the upper Au layer of 90 A(ring) can be explained by normal calculation of the optical electromagnetic wave solution of Maxwell's equations for each interface and reciprocity. However, the angular pattern in the upper 400 A(ring) Au thickness layer cannot be accounted for by the normal approach without considering the intensity of the x-ray sheet beam emerging from the end of the multilayer. © 1995 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.114654

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3

Digitale Medien

Refracted X-ray Fluorescence (RXF) on Si single crystal and GaAs (1991)

Sasaki, Y. C. ; Hirokawa, K.

Springer

Applied physics 52 (1991), S. 28-32

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ISSN: 1432-0630

Schlagwort(e): 42.10.Fa ; 07.60.Hv ; 78.70.Ck

Quelle: Springer Online Journal Archives 1860-2000

Thema: Maschinenbau , Physik

Notizen: Abstract The Refracted X-ray Fluorescence (RXF) method can obtain the information about surfaces and interfaces: for example, surface electron density, chemical condition and surface roughness. We evaluated surfaces and interfaces of ultrathin films by using RXF method, and we measured the average lattice constant of a ultrathin GaAs film, the top-layer of a GaAs substrate and the surface roughness of the Si substrate below a ultrathin GaAs film grown by MBE.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF00323681

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4

Digitale Medien

Time-resolved fluorescent X-ray interference (1998)

Sasaki, Y. C. ; Suzuki, Y. ; Yamanashi, H. ; [weitere]

Chester : International Union of Crystallography (IUCr)

Journal of synchrotron radiation 5 (1998), S. 1075-1078

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ISSN: 1600-5775

Quelle: Crystallography Journals Online : IUCR Backfile Archive 1948-2001

Thema: Geologie und Paläontologie , Physik

Notizen: A fluorescent X-ray interference method can effectively measure nanometer-level conformational changes for non-crystallized molecules and proteins in aqueous conditions. The time-resolved technique can be used to obtain information about the dynamics of molecules and proteins. Instrumentation for time-resolved fluorescent X-ray interference has been designed. A typical interference-fringe pattern was observed with approximately 3 s of X-ray exposure time from K-fluorescent X-rays emitted from a Zn monoatomic layer on an Rh substrate. The primary X-ray beam was polychromed with a mirror for total external reflection of X-rays and was tuned to an energy level at which only Zn K radiation became optimally excited. The glancing angle of the primary X-ray beam was fixed at a glancing angle at which the total intensity of K-fluorescent X-rays emitted from Zn atoms corresponded to the maximum value. The fluorescent X-ray interference fringes were monitored with an imaging plate (IP) as a non-energy-dispersive two-dimensional detector. The exposed interference fringes on the IP were integrated along the direction of the fringes. The integrated fringes were in close agreement with a theoretical estimate based on the interference among transmitted and reflected waves at interfaces in the sample.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1107/S0909049598002787

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5

Digitale Medien

Structural information from the interference effect of electron-capture X-rays (1999)

Sasaki, Y. C. ; Yasuda, K. ; Takahashi, M. ; [weitere]

Springer

Journal of radioanalytical and nuclear chemistry 239 (1999), S. 341-344

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ISSN: 1588-2780

Quelle: Springer Online Journal Archives 1860-2000

Thema: Chemie und Pharmazie , Energietechnik

Notizen: Abstract We observed the interference effect of electron-capture X-rays emitted by the nuclear transformations in radioisotopes. This interference is between the direct monochromatic emission from the radioactive atoms and the emission totally reflected by the substrate surface. Nanometer-level structural information about the radioactive atoms can be obtained by analyzing the measured interference fringes because the period of these fringes depends on the position of the radioactive atoms relative to the substrate surface. In this work, we used the functional protein molecules (myosin subfragment 1 (S1)) which were radioiodinated with no carrier added125I to observe the conformational changes in aqueous solutions.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1007/BF02349508

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