Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
65 (1989), S. 1133-1139
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present calculations of the properties of the slow-mode surface plasmon supported by certain planar metal-oxide-metal tunnel junctions. We study the Al–Al oxide–Ag and Al–Al oxide–Au device structures commonly used in light-emission experiments and give the dispersion, propagation decay length, and field profile of the mode in devices of typical dimensions over the energy range 1.4–3.8 eV. We also consider the dependence of the dispersion and decay length on the thickness of the oxide barrier and the likely effect of interface roughness. The bearing of these results on roughness-coupled interconversion between the slow- and fast-mode plasmons is discussed, and we comment on the possibilty of obtaining radiation directly from the slow mode.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.343051
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