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  • 1
    Electronic Resource
    Electronic Resource
    Oxygen Grain-Boundary Diffusion in Polycrystalline Mullite Ceramics (2004)
    Oxford, UK : Blackwell Publishing Ltd
    Journal of the American Ceramic Society 87 (2004), S. 0 
    Details
    ISSN: 1551-2916
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Oxygen tracer diffusivities of low- and high-alumina mullite ceramics (72 wt% Al2O3, 28 wt% SiO2 and 78 wt% Al2O3, 22 wt% SiO2, respectively) were determined. Gas/solid exchange experiments were conducted in an atmosphere enriched in the rare stable isotope 18O, and the resulting 18O isotope depth distributions were analyzed using SIMS depth profiling. The investigation showed that grain-boundary diffusivities for both mullite ceramics were several orders of magnitude higher than mullite volume diffusivity. Activation enthalpies of oxygen diffusion were 363 ± 25 kJ/mol for the low-alumina and 548 ± 46 kJ/mol for the high-alumina materials. Because the glassy grain-boundary films were not identified, the differences between the low- and high-alumina materials might be explained by different impurity concentrations in the grain boundaries of the two materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1151-2916.2004.tb07497.x
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  • 2
    Electronic Resource
    Electronic Resource
    Quantitative electron-probe microanalysis of light elements: Determination ofa-Si∶C∶N∶O∶H insulating films (1989)
    Springer
    Microchimica acta 98 (1989), S. 233-241 
    Details
    ISSN: 1436-5073
    Keywords: electron-probe microanalysis (EPMA) ; light elements (C, N, O) ; thin films ; organo-silicon polymers ; hydrogen ; chemical state
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Amorphous Si∶C∶N∶O∶H films (1–3 μm) are studied by EPMA after deposition of gold (1–5 nm) as a conductive coating. Its influence on thek-ratios (X-ray intensity relative to an uncoated standard) of silicon, carbon, nitrogen and oxygen is described as a linear function of the simultaneously determinedk-ratio of gold. Thek-ratios representing the uncoated specimen are obtained by extrapolation and, in combination with the PAP matrix correction model, quantitative EPMA can be performed with an analytical error of 2–5%, as it is demonstrated by samples of SiC, Si3N4 and SiO2. No systematic shift of the concentrations is observed for layers ofa-Si∶C∶N∶O∶H determined at various electron energies of 5–12.5 keV. Hydrogen is calculated by difference and the concentrations prove to be a useful estimate in agreement with the results of chemical analysis. Si-Kβ/Si-Kβ′ spectra recorded on organo-silicon films and binary silicon compounds point out significant differences concerning the formation of Si-C, Si-N and Si-O chemical bonds.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01244599
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  • 3
    Electronic Resource
    Electronic Resource
    EPMA and Quantitative MCs+-SIMS of Metal-DLC Coating Materials (2000)
    Springer
    Microchimica acta 132 (2000), S. 419-427 
    Details
    ISSN: 1436-5073
    Keywords: Key words: EPMA; MCs+-SIMS; metal-DLC; quantification; depth profiling.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract.  Compositional characterization of metal-DLC (metal-containing diamond-like carbon) hard coatings is carried out by (WDS)-EPMA and MCs+-SIMS. EPMA enables accurate (± 5% relative) quantitative analysis including minor concentrations (0.1–10 at%) of N, O and Ar. Under conditions of “near-surface” EPMA (E0 〈 10 keV) the influence of surface oxide films on “pure” metal standards may be a limiting factor in respect of accuracy. Depth profiling of sufficiently “thick” layered structures (film thickness ≥ 2 μm) is carried out by EPMA-line scans along mechanically prepared bevels. The depth resolution is about 0.2 μm. SIMS in the MCs+-mode enables high resolution (〈 20 nm) depth profiling of metal-DLC layered structures including the determination of H (1–20 at%). MCs+-SIMS, i.e. employing Cs+ primary ions and monitoring MCs+ molecular secondary ions (M is the element of interest) is presented as a promising route towards sufficiently accurate (10–20%) SIMS-quantification. Matrix-independent relative sensitivity factors for MCs+-SIMS are derived from homogeneous coating materials defined by EPMA. EPMA proves to be also useful to detect problems related to SIMS of Ar in metal-DLC materials. The combination EPMA-SIMS is demonstrated as an effective analytical strategy for quality control in industrial production and to support the development of metal DLC layered structures with optimum tribological properties.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s006040050089
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  • 4
    Electronic Resource
    Electronic Resource
    Comparative Analysis of a Solar Control Coating on Glass by AES, EPMA, SNMS and SIMS (2000)
    Springer
    Microchimica acta 132 (2000), S. 429-434 
    Details
    ISSN: 1436-5073
    Keywords: Key words: AES; EPMA; SNMS; SIMS; glass coating.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract.  A solar control coating was analysed by different methods of surface analysis with respect to the layer sequence and the composition and thickness of each sublayer. The methods used for depth profiling were Auger electron spectroscopy, electron probe microanalysis, secondary neutral mass spectroscopy and secondary ion mass spectroscopy based on MCs+. The structure of the coating was unknown at first. All methods found a system of two metallic Ag layers, embedded between dielectric SnOX layers. Additionally, thin Ni-Cr layers of 1–2 nm were detected on top of the Ag layers. Thus the detected layer sequence is SnOX/Ni-Cr/Ag/SnOX/Ni-Cr/Ag/SnOX/glass. The Ni:Cr ratio in the nm-thin layers could be quantified by every method, the Cr fraction corresponding to less than one monolayer. We compare the capabilities and limitations of each method in routinely investigating this solar control coating. Importance was attached to an effective investigation. Nevertheless, by combining all methods, measuring artefacts could be uncovered and a comprehensive characterisation of the system was obtained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s006040050090
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  • 5
    Electronic Resource
    Electronic Resource
    Quantitative analysis of W-C:H coatings by EPMA, RBS (ERD) and SIMS (1994)
    Springer
    Microchimica acta 114-115 (1994), S. 525-532 
    Details
    ISSN: 1436-5073
    Keywords: EPMA ; RBS (ERD) ; SIMS ; tribological coatings ; quantitative analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Several analytical techniques have been used to characterize homogeneous films of tungsten-containing hydrogenated carbon (W-C: H), deposited on Si with a film thickness of 1–1.5 μm. Electron probe microanalysis (EPMA) enables one to determine the major components W (3–43 at %) and C, impurities (〈 2 at %) of Ar and O, and the mass thickness (300–1800 μg/cm2) of the films. The agreement between the results of EPMA and the data (W-content, mass thickness) provided by Rutherford backscattering spectrometry (RBS) is 5–10% relative. Quantitative analysis of hydrogen in W-C:H films (1–16 at %) is carried out by the technique of elastic recoil detection (ERD). A suitable scheme for the determination of H in W-C: H films by SIMS is proposed, based on monitoring the intensity ratio of HCs+/CCs+ secondary ions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01244579
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  • 6
    Electronic Resource
    Electronic Resource
    SIMS Profiling and TEM of CVD Films on Multi-Filament Samples (2000)
    Springer
    Microchimica acta 133 (2000), S. 183-186 
    Details
    ISSN: 1436-5073
    Keywords: Key words: SIMS; depth profiling; HRTEM; CVD; fibre coatings.
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract.  A suitable fibre coating is essential to obtain optimal fibre-matrix interaction in fibre-strengthened composite materials. Thin films (∼100 nm) of silicon carbide, turbostratic carbon, and boron nitride were deposited by CVD as single or double layers on commercial multi-filament fibres in a continuous process. The fibre material itself may be carbon, alumina, silicon carbide, or a quaternary ceramic of SiCBN. The application of MCs+-SIMS enables one to determine the composition (including impurities of H and O) of various fibre coating materials with an accuracy of at least 20% relative. Due to the special geometry of the multi-filament samples the depth resolution of the SIMS depth profiles is limited, nevertheless, layered structures and some details of the interface between coating and fibre can be studied. The depth calibration of the SIMS depth profiles is derived from sputter rates established on flat samples with a composition similar to that of the fibre coating material. However, the obtained film thicknesses are not extremely different from the values derived from TEM on cross sections of coated fibres.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s006040070090
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