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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 5533-5533 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The spin-spray plating (SSP) is an equilibrium chemical process with which spinel ferrite films can be grown on a variety of substrate materials at temperatures as low as 100 °C. The process is particularly attractive for the monolithic integration of microwave magnetic and electronic GaAs devices. The study of the electrical characteristics of these films is part of an effort aimed at achieving this integration. Low-loss microwave magnetic devices require that the materials used have dielectric loss tangents (tan δ) on the order of 0.001 or lower, and dc resistivities greater than 107 Ω cm. In the SSP process, control of the chemical composition of the films is limited by an incompatibility of desirable transition metal ions (e.g., Fe,Ni,Zn,Mn) with the tetrahedral and octahedral cation sites available in the spinel structure. Therefore, the substitution of a specific cation modifies the site distribution of other ions in the spinel lattice. The overall distribution of the metallic cations determines the electrical and magnetic properties of the ferrite films. Specifically, low resistivity is due to the mixtures of high- and low-valence cations of a metal element in the same lattice site. In this study Ni-Zn ferrite films were produced with resistivities ranging from 10 to 106 Ω cm. Dielectric loss tangents measured, however, were several orders of magnitude higher than desired. Predictably, the loss tangent decreases monotonically with increasing resistivity; however, its values are much higher than the literature values for ceramic ferrites and semiconducting materials for the same range of dc resistivities. The reasons for this are presently being investigated.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 354-356 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An important component of fracto-emission is the emission of electrons (EE) accompanying the fracture of materials. In this letter we present measurements of EE accompanying the fracture of MgF2 single crystals loaded in three-point bend. In particular, we examine the effect of changing the crystal orientation relative to the loading direction on emission intensity. We find that fracture surfaces with different crystal orientations yield significantly different EE. We propose that this is due to differences in the density of defects produced by such a fracture.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5819-5821 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spin-spray is a low-temperature plating technique for which application to the growth of ferrite polycrystalline thin films on various substrates was introduced by Abe et al. a few years ago. This technique is particularly attractive because of the possibility it offers for integrating ferrite devices with GaAs microwave monolithic integrated circuits, since growth occurs at temperatures on the order of 90 °C. In particular, the growth of Ni-Zn ferrite films has been demonstrated and these films could be used to build microwave nonreciprocal devices such as isolators and circulators. In order to understand and utilize the microwave magnetic properties of these films, a study of their ferromagnetic resonance (FMR) characteristics, as a function of composition and growth conditions, has been conducted. Important parameters such as saturation magnetization, FMR linewidth, and gyromagnetic ratio were calculated from the data obtained. Compositional and structural nonuniformities were also revealed in the analysis in the form of multiple resonances present in some of the samples analyzed.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 827-830 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Studies of subgrain structures in Tl3AsSe3 have been performed by x-ray topography. Birefringent interference patterns show that a direct correlation exists between the subgrain structures and the optical homogeneity of the crystals. A quantitative measurement of lattice misorientation was performed from the interference patterns and compared with x-ray rocking measurements. The origin of the subgrains is also discussed in detail.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 2258-2266 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Lattice defect structures within large grains of cast polycrystalline silicon have been investigated using optical microscopy, x-ray topography, and electron-beam-induced conductivity (EBIC) measurements. Optical observations through a series of wafers of an ingot indicate that kinks in high-angle grain boundaries develop by forming straight grain boundaries rather than curved boundaries. It is also observed that a junction of three grain forms a kink in the grain boundary. X-ray topographic observations of lattice defects show that cumulative dislocations are generated at these kinks when the material is subjected to thermal stresses at sufficiently elevated temperatures during solidification. Subsequently the dislocations propagate into the grain volume and form subgrain boundaries. In some cases, they pile up in the coherent {111} twin boundary interfaces. Observed EBIC constrast has shown that both dislocations and subgrain boundaries are electrically active and serve to decrease the effective minority carrier diffusion length.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract A reasonably perfect cyclotrimethylenetrinitramine (RDX) explosive crystal has been studied by surface reflection (Berg-Barrett) X-ray topography for the purpose of further elucidating the microstructural basis for hot spots forming in secondary explosives. Topographs were obtained through the base (¯2 1 0) surface of a crystal grown by slow evaporation from an acetone solution. (¯7 2¯1) and (¯6 3¯2) reflections have revealed the central strain field of a large growth defect. This type of defect is proposed to be a suitable internal obstacle for triggering dislocation pile-up collapse during crystal deformation and fracture. Also, extremely localized plastic deformation zones were revealed at Knoop microindentations employed to measure the hardness anisotropy in the (¯2 1 0) crystal surface. A combination of restricted slip systems and cracking is responsible for the significant anisotropy.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1573-4803
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract A reasonably perfect cyclotrimethylenetrinitramine (RDX) explosive crystal has been studied by surface reflection (Berg-Barrett) X-ray topography for the purpose of further elucidating the microstructural basis for hot spots forming in secondary explosives. Topographs were obtained through the base (¯2 1 0) surface of a crystal grown by slow evaporation from an acetone solution. (¯7 2¯1) and (¯6 3¯2) reflections have revealed the central strain field of a large growth defect. This type of defect is proposed to be a suitable internal obstacle for triggering dislocation pile-up collapse during crystal deformation and fracture. Also, extremely localized plastic deformation zones were revealed at Knoop microindentations employed to measure the hardness anisotropy in the (¯2 1 0) crystal surface. A combination of restricted slip systems and cracking is responsible for the significant anisotropy.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Springer
    Journal of materials science 3 (1984), S. 560-562 
    ISSN: 1573-4811
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
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