ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A complete micropositioning unit based on high precision, manually controlled X-Y-Z translators, related metrology system, and sighting microscope is described. It has been specifically developed for the alignment of collimating pinholes (5–10 μm diam) on cryogenic x-ray detectors, 10–50 μm in size, deposited both on transparent and opaque substrates. The main characteristics of this flexible and convenient system are the capability to handle a complete test fixture ready for further measurements at cryogenic temperature, coupled with the possibility to verify the precision attained. Such microalignment equipment will find application in optical/UV/x-ray photon counting experiments, whenever a highly collimated illumination is required or in any test involving precision positioning of small experimental units onto microdevices or detectors.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145124
Permalink