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  • 1
    Electronic Resource
    Electronic Resource
    The effect of oxidation state on the intensities of Kβ5 and Kβ″ of 3d-transition elements (1975)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 4 (1975), S. 186-189 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Using a commercially available flat crystal spectrometer in a slightly modified form, an investigation was made of the peak intensity ratios (Kβ5/Kβ1) and the relative intensities of Kβ″ to Kβ5 in different oxidation states of 3d-transition metal atoms existing in forms of oxidic compounds. The peak intensity ratios (Kβ5/Kβ1) for V, Cr, Mn, Fe, Co, Ni and Cu, as well as the peak profiles of Kβ″ and Kβ5 for V, Cr and Mn, were investigated. Results suggest that changes in the intensities of the Kβ5 and Kβ″ bands can be applied to determining the oxidation number of a metal atom in its oxide.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300040408
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A fundamental parameter method for measurement of the thickness of pure element films by an EDX technique with a proportional detector (1984)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 13 (1984), S. 182-186 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Application of the fundamental parameter method to the determination of film thickness by an EDX technique with a proportional detector was performed by considering that x-rays striking the detector were composed of the following kinds: (1) the analyte line of the film excited directly by the primary beam, (2) the analyte line of the film excited secondarily by scattered or characteristic x-rays from the substrate and (3) scattered and characteristic x-rays from the substrate which passed through the film to be analysed. The intensity of all these types were considered theoretically, and the film thickness was evaluated by fitting the theoretical intensity of the x-rays striking the detector to the experimental intensity, by use of an iteration process. In addition, the accuracy of the theoretical values of intensities excited secondarily was verified by comparison with the experimental values.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300130412
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
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