ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The analysis of x-ray fluorescence lines with total energy resolution of 1 eV or better can provide detailed information on the electronic structure of the sample in addition to quantitative elemental analysis of the sample. A perfect crystal spectrometer was developed for this purpose. Preliminary results from a series of chromium oxides will be presented. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1147385
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