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  • 1
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A Thomson scattering system on the Hanbit magnetic mirror device has been installed to measure the electron temperature and density of the plasma in the central cell. The configuration is based on a standard 90° scattering scheme. The optical system consists of a Q-switched Nd:YAG laser, input optics, collection optics, spectrograph optics, detectors, and a data acquisition system. Although the laser beam path is about 50 m long and the background emissions are not low, the electron temperature measurements have been made at a single point on a shot-by-shot basis, in which the stray light was considerably suppressed by using a beam dump, a viewing dump, and baffles. The measured electron temperature is about 50–70 eV in experiments for plasma production and heating by ICRF of 200-kW-rf power using a slot antenna. A description of the installed system and the experimental results are presented. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5495-5497 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: rf-sputtered amorphous CoZrNb (CZN) thin films have been shown to be promising materials for high-density magnetic recording heads. In this paper, we report correlations of the physical and micromagnetic structures with the magnetic properties of CZN films using transmission electron microscopy (TEM) techniques. Observations of the physical microstructures of CZN films verify that one of the apparent effects of the applied magnetic field during film deposition is to suppress crystallization. We have also observed that the number of the microcrystallites which coexist with the amorphous matrix is reduced by an applied magnetic field. We show that the coercivities of CZN films are correlated with the sizes and volume fractions of the microcrystallites. The contribution of the microcrystalline phase to magnetic anisotropies is discussed in terms of the residual anisotropy after rotational magnetic field annealing and the magnetization ripple amplitudes observed in the films. In addition, we report on investigations of the in situ crystallization processes of thin CZN films (500 A(ring)) using a TEM hot stage.
    Type of Medium: Electronic Resource
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