ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We have developed a low-noise, high-sensitivity charge-coupled-device (CCD) technology for imaging applications extending from the soft x-ray (1 A(ring)) to the near-infrared (10 000 A(ring)) regimes. We have also developed a fabrication technology for making back-illuminated versions of these devices with quantum efficiencies as high as 90% from 5000 to 7000 A(ring). Our efforts have focused on two devices, a 64×64 pixel back-illuminated imager with two output ports that operates at 2000 frames per second with 23 electrons read noise, and a larger device, with 420×420 pixel format, designed for lower frame rates with noise as low as 1.5 electrons and used at visible, UV, and x-ray wavelengths. Applications to plasma diagnostics include Thomson scattering and high-frame-rate imaging in the visible, as well as x-ray imaging and bolometry.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141818
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