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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 57 (1986), S. 766-769 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The characteristics and design parameters of low-velocity superconducting resonators for the acceleration of heavy ions are reviewed and discussed. Recent results obtained on lead-plated split-ring and half-wave resonators are also presented.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 304-306 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Films nominally 80 μm thick of Bi-Sr-Ca-Cu-O on silver substrates with surface areas from 1.25 to 182 cm2 were fabricated using two different processing procedures. Their rf surface resistances were measured as functions of temperature in the frequency range 2.65–29.2 GHz at low rf field amplitudes using cylindrical resonant cavities. The critical temperatures of the films were in the range 81–83 K. At X-band frequencies, the surface resistances matched that of room-temperature copper. The results were comparable to recent data on small pellets of bulk Bi-Sr-Ca-Cu-O.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2207-2210 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A coaxial niobium quarter-wave resonant cavity has been fabricated and used for measurement of the surface resistance of disk-shaped samples of high-Tc superconductors at 820 MHz and 4.2 K, and at surface rf magnetic fields ranging to 300 G. The cavity can accommodate samples as large as 36 mm in diameter. A measurement procedure has been developed with which rf surface resistances less than 20 μΩ can be resolved for a 24-mm-diam sample at 820 MHz. This cavity is useful in determining the suitability of high-Tc superconductors for high-power rf applications.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 930-932 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Cylindrical rods of YBa2Cu3O7−δ from 0.6 to 1.9 mm in diameter and up to 565 mm long have been used as the center conductor of a half-wave resonant coaxial line. The resonant line can be immersed in liquid nitrogen, which provides excellent cooling of the current-carrying superconducting surface, even in the presence of substantial rf losses. Such superconducting resonant lines have been operated at frequencies of a few hundred MHz and at rf surface magnetic fields up to 150 G at 77 K.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The increase in the microwave surface resistance Rs of high Tc superconductors at elevated microwave power levels is reported for both oriented and unoriented Tl-based films as a function of rf magnetic field at 820 MHz and 18 GHz. The application of dc magnetic fields produces qualitatively similar increases in Rs and in the surface reactance Xs. The increase in Rs with dc field is shown to arise from simple decoupling of grains by intergranular magnetic flux. The increase in Rs with microwave power, on the other hand, is a consequence of hysteretic intergranular processes.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 514-516 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High surface electric fields have been obtained in the first tests of a superconducting rf quadrupole device. The rf quadrupole fields were generated between niobium vanes 6.5 cm in length, with an edge radius of 2 mm, and with a beam aperture of 6 mm diameter. In tests at 4.2 K, the 64 MHz device operated cw at peak surface electric fields of 128 MV/m. Virtually no electron loading was observed at fields below 100 MV/m. It was possible to operate at surface fields of 210 MV/m in pulses of 1 ms duration using a 2.5 kW rf source. For the vane geometry tested, more than 10 square centimeters of surface support a field greater than 90% of the peak field. The present result indicates that electric fields greater than 100 MV/m can be obtained over an appreciable area, sufficient for some accelerator applications. It also shows that superconducting rf technology may provide an extended range of options for rf quadrupole design.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Journal of superconductivity 3 (1990), S. 243-250 
    ISSN: 1572-9605
    Keywords: High-T c ; superconductors ; microwave ; accelerator
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We report measurements of the r.f. surface resistance of a wide variety of high-T c superconductors in bulk form and as films on silver substrates. Several apparatuses have been constructed and used for measurements at frequencies from 0.15 to 40 GHz and r.f. surface magnetic fields as high as 640 G. In every case in which the field dependence of the surface resistance was measured, the surface resistance increased monotonically with field amplitude through a transition region characterized by a strong field dependence. It then saturated at high field at a value of a few percent of the normal-state surface resistance just aboveT c . In the presence of this field dependence, the frequency dependence of the surface resistance changed from quadratic to less than linear.
    Type of Medium: Electronic Resource
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