Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
55 (1989), S. 304-306
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Films nominally 80 μm thick of Bi-Sr-Ca-Cu-O on silver substrates with surface areas from 1.25 to 182 cm2 were fabricated using two different processing procedures. Their rf surface resistances were measured as functions of temperature in the frequency range 2.65–29.2 GHz at low rf field amplitudes using cylindrical resonant cavities. The critical temperatures of the films were in the range 81–83 K. At X-band frequencies, the surface resistances matched that of room-temperature copper. The results were comparable to recent data on small pellets of bulk Bi-Sr-Ca-Cu-O.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.102411
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