Library

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 304-306 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Films nominally 80 μm thick of Bi-Sr-Ca-Cu-O on silver substrates with surface areas from 1.25 to 182 cm2 were fabricated using two different processing procedures. Their rf surface resistances were measured as functions of temperature in the frequency range 2.65–29.2 GHz at low rf field amplitudes using cylindrical resonant cavities. The critical temperatures of the films were in the range 81–83 K. At X-band frequencies, the surface resistances matched that of room-temperature copper. The results were comparable to recent data on small pellets of bulk Bi-Sr-Ca-Cu-O.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...