Electronic Resource
Götz, M.
;
Blüthner, K.
;
Krech, W.
;
[et al.]
Nowack, A.
;
Fuchs, H.-J.
;
Kley, E.-B.
;
Thieme, P.
;
Wagner, Th.
;
Eska, G.
;
Hecker, K.
;
Hegger, H.
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
78 (1995), S. 5499-5502