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An ultrahigh vacuum scanning Kerr microscope (1997)

Vaterlaus, A. ; Maier, U. ; Ramsperger, U. ; [et al.]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 68 (1997), S. 2800-2804

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: A new ultrahigh vacuum instrument allowing in situ Kerr microscopy and scanning tunneling microscopy is described. The Kerr microscope has a spatial resolution of about 1 μm. First experimental results are reported on the magnetism of a 5 μm wide stripe consisting of six atomic layers of Fe grown in situ by molecular beam epitaxy on a W(110) surface. © 1997 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1148198

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