Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Resolution enhancement in three-dimensional confocal microscopy (1991)
    Springer
    Machine vision and applications 4 (1991), S. 233-242 
    Details
    ISSN: 1432-1769
    Keywords: Optical sectioning property ; lateral resolution ; confocal scanning optical microscope ; pupil plane filter ; composite image
    Source: Springer Online Journal Archives 1860-2000
    Topics: Computer Science
    Notes: Abstract We discuss various methods of tuning and improving both the optical sectioning strength and the lateral resolution of the confocal scanning optical microscope. Techniques based on using different wavelengths, pupil plane filters, different sized detectors and laterally displaced detectors are considered and experimental results presented. Both bright field reflection and fluorescence imaging are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01815300
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Optical measurement of the ambipolar diffusion length in a ZnCdSe–ZnSe single quantum well (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 536-538 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe a straightforward technique for the measurement of carrier diffusion in semiconductors. Using an optical microscope we can spatially image luminescence with a resolution of ∼500 nm. We measured the ambipolar diffusion length in a Zn0.75Cd0.25Se–ZnSe single quantum well by fitting the spatially resolved luminescence profile with the solution of the two-dimensional diffusion equation. The ambipolar diffusion length was found to be 498 nm at a carrier density of ∼1×1018 cm−3 and we deduce an ambipolar diffusion constant of 1.7 cm2 s−1. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.364094
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Splice loss in single- and twin-core buried channel waveguide devices (1994)
    Springer
    Optical and quantum electronics 26 (1994), S. 45-62 
    Details
    ISSN: 1572-817X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We quantify the magnitude of the power loss incurred when a square-core buried channel waveguide (BCW) is spliced to a standard circular-core telecommunications fibre. With a view to minimizing the dissipated power, we show that a simple equal-core-area criterion provides an elegant means of determining the optimum core dimensions. This result is found to hold for more general BCW cross-sections that possess a reasonable degree of symmetry. The fundamental problems of waveguide misalignment and angular tilt are also investigated and their effect on splice loss is quantified. Our theoretical model is applied to both single- and twin-core waveguides.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00573900
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    On the right-angle X-junction diffraction model (1995)
    Springer
    Optical and quantum electronics 27 (1995), S. 261-266 
    Details
    ISSN: 1572-817X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract We review the important features of the right-angle X-junction diffraction model and discuss both its theoretical framework and its validity range. In addition, we present explicit new results from BPM calculations that show that the analytical model aptly describes the dominant physical processes involved and provides bounds on the numerical results. We also address some misinterpretations of the model that have recently appeared in the literature.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00631752
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Analysis and design of highly broad-band, planar evanescent couplers (1996)
    Springer
    Optical and quantum electronics 28 (1996), S. 71-81 
    Details
    ISSN: 1572-817X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract It is shown that by taking advantage of the maximum in the spectral dependence of the coupling coefficient, very broad-band symmetric and asymmetric single-mode planar couplers can be designed. The symmetric coupler allows at least 95.6% coupling between the two cores over the wavelength range 1.3–1.58 μm, while the asymmetric coupler can act as a 3 dB splitter with only ±1.6% variation in the splitting ratio over the wavelength range 1.3–1.67 μm. In both cases, the design includes the curved input-output arms, and the estimated bend loss is approximately 0.1 dB.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00578552
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 6
    Electronic Resource
    Electronic Resource
    Coupling characteristics of photo-induced Bragg gratings in depressed- and matched-cladding fibre (1996)
    Springer
    Optical and quantum electronics 28 (1996), S. 1641-1654 
    Details
    ISSN: 1572-817X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Experimental transmission spectra of ultraviolet (u.v.)-written Bragg gratings in depressed- and matched-cladding fibre are characterized and compared. In particular, we discuss how the location and strength of the spectral features vary with the degree of blazing, or angular tilt of the grating. The fine-structure detail on the short-wavelength side of the fundamental Bragg line is attributed to power coupling between the forwardpropagating fundamental (LP01) mode and discrete, backward-propagating cladding modes. Resonances corresponding to backward-propagating LP0n and LP1n modes are identified, and their relative strengths are compared with theoretical overlap calculations. Physical arguments are presented that explain the pronounced ‘ghost’-grating notch that appears in the transmission spectra of blazed, fibre Bragg gratings in depressed-cladding fibre.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00331054
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 7
    Electronic Resource
    Electronic Resource
    Second-mode cutoff in rectangular-core couplers using the Fourier decomposition method (1995)
    Springer
    Optical and quantum electronics 27 (1995), S. 987-994 
    Details
    ISSN: 1572-817X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract By transforming the infinitex-y plane onto the unit square and using two-dimensional Fourier series expansions, the modal fields and propagation constants of dielectric waveguides can be accurately determined within the scalar (weak-guidance) regime. In particular, the method gives cutoffV-values directly. By applying the technique to symmetric and asymmetric rectangular-core couplers, the second-mode cutoffV-value is determined numerically as a function of both the centre-to-centre core separation and the core aspect ratios. Approximate analytical expressions are derived from the exact numerical data which give the cutoff values to within 2.5%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00558490
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...