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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 420-423 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Measurement of the light emission spectrum from a scanning tunneling microscope (STM) requires a long exposure time due to its extremely low intensity, and thermal drift of the tip during the exposure time limits the spatial resolution. To improve the resolution, a computer controlled servomechanism that locks the STM tip over a target position has been developed. We have measured the light emission spectra from individual nanometer scale structures on an evaporated Au film with and without this mechanism, and demonstrated the effectiveness of the servomechanism. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 2487-2489 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning tunneling microscope (STM) light emission spectroscopy with picosecond time resolution has been developed and applied to the measurement of time-resolved spectra of STM light emission from an evaporated Au film. The spectra consist of two components in the time-energy domain. The first component is excited by the picosecond tunneling current pulses that are generated by picosecond laser irradiation at the STM tip-sample gap. The second component arises from the plane-wave surface plasmon polaritons that are excited at the Au surface by the laser and made radiative by the presence of the STM tip that breaks the translational symmetry of the surface. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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