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Servomechanism for locking scanning tunneling microscope tip over surface nanostructures (2000)

Ito, K. J. ; Uehara, Y. ; Ushioda, S.

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 71 (2000), S. 420-423

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ISSN: 1089-7623

Source: AIP Digital Archive

Topics: Physics , Electrical Engineering, Measurement and Control Technology

Notes: Measurement of the light emission spectrum from a scanning tunneling microscope (STM) requires a long exposure time due to its extremely low intensity, and thermal drift of the tip during the exposure time limits the spatial resolution. To improve the resolution, a computer controlled servomechanism that locks the STM tip over a target position has been developed. We have measured the light emission spectra from individual nanometer scale structures on an evaporated Au film with and without this mechanism, and demonstrated the effectiveness of the servomechanism. © 2000 American Institute of Physics.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1063/1.1150217

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