ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We have examined the initial interface formation and subsequent film growth for Fe films on the As-terminated (2×4) reconstructed surface of GaAs(001) in an effort to correlate the initial adsorption sites and film growth with the magnetic anisotropy. The growth and surface studies were performed in a four chamber ultrahigh vacuum system which incorporates UHV sample transfer between the chambers for III–V semiconductor growth, metal growth, photoelectron diffraction (PED), and scanning tunneling microscopy (STM). After coating with a thin film of Au (40 A(ring)) at room temperature, the samples were removed from the system for postgrowth characterization, which included ferromagnetic resonance and magnetometry. The GaAs(001) surface was prepared via homoepitaxial growth by MBE, with the growth terminated in a manner which resulted in a well-ordered As-dimer terminated (2×4) reconstructed surface as revealed by reflection high energy electron diffraction and STM. Fe deposition was performed in a second MBE chamber for coverages which ranged from 0.1 ML to several tens of monolayers at a substrate temperature of 175 °C.The sample was then transferred under UHV to either the PED or STM chamber to determine the initial adsorption sites, growth mode, and evolution of film structure with increasing coverage. For the lowest coverages studied (0.1 ML), we obtain evidence for preferential adsorption at As-dimer sites. At a coverage of 1 ML, two-dimensional islands form approximately 20 A(ring) in size, but elongated along the missing dimer rows with an aspect ratio of 2:1. At high coverages ((approximately-greater-than)40 A(ring)), we observe three-dimensional mounds or clusters with an average in-plane diameter of approximately 100 A(ring) and a narrow size distribution. Even at this coverage, the monolayer terraces of the GaAs substrate are clearly visible in the STM image, with the Fe film uniformly growing on each terrace. Photoelectron diffraction in the forward scattering regime (high electron kinetic energy) is utilized to determined the growth mode. At low kinetic energy, information on the adsorption site is obtained from Auger electron diffraction and compared with the results of the real space STM images.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.361528
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