Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Trace elements in skin epitheliomas (1987)
    Springer
    Journal of radioanalytical and nuclear chemistry 109 (1987), S. 89-100 
    Details
    ISSN: 1588-2780
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology , Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract Skin tissue samples from 41 patients suffering from skin epitheliomas were analyzed by the PIXE method. Skin samples from the non-affected areas and blood serum were also analyzed for the same patients. The elements determined were K, Ca, Cr, Mn, Fe, Ni, Cu, Zn, Br, Rb, and Pb. Their concentrations in the healthy skin and the serum were normal. The concentrations in the lesions were nearly the same for both basal cell and squamus cell epitheliomas (BCE and SCC) except for higher zinc and lower bromine values in the BCE samples. However, substantial differences were observed between the affected and non-affected skin.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02117526
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Efficiency calibration of a Ge(In) semiconductor detector by thin- and thick-arget PIXEPresented at the European Conference on EDXRS Myconos, Greece, May 30-June 6 1992. (1994)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 23 (1994), S. 96-99 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The efficiency of a Ge(In) semiconductor x-ray detector was measured in the energy region 1-25 keV using proton-induced x-rays from thick targets and from thin targets of standard thickness, and the results of the two calibration methods were compared. A proton energy of 2.00 MeV was used in an external beam facility. A model based on fundamental parameters (mass absorption coefficients, fluorescence yields and relative x-ray emission rates) was used to reproduce the experimental results.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300230211
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Thick target X-ray yields from proton bombardment (1988)
    New York, NY [u.a.] : Wiley-Blackwell
    X-Ray Spectrometry 17 (1988), S. 13-16 
    Details
    ISSN: 0049-8246
    Keywords: Chemistry ; Analytical Chemistry and Spectroscopy
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The production yields for characteristic x-rays from the bombardment of thick targets by protons are calculated by integrating the x-ray production cross-section for each element for the whole range of the protons, taking into account the self-absorption of x-rays. A simple approximation which can be applied with a pocket calculator is also presented, using simplified relationships for the energy dependence of the proton stopping power and the x-ray production cross-sections. The approximation allows very fast calculations, has an accuracy of better than 5% for low-energy protons and is also very useful for the first steps in a computer program for PIXE analysis of thick targets, using the method of iterations. The calculated yields are compared with experimental results obtained on thick specimens of pure elements, compounds and standards.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/xrs.1300170104
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...