ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We present a new scanning force microscope (SFM) design with a compact fiber-optic interferometric detection system that provides very high resolution for surface force measurements. The mechanical conception of the instrument includes the implementation of piezoelectric actuators for the interferometer alignment. The result of this approach is a high performance SFM with both easy handling and high versatility.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144477
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