ISSN:
1063-7826
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract The results of experimental studies of the effect of γ-irradiation on the electrical properties of MIS structures containing the rare-earth oxides Y2O3, Dy2O3, Tb2O3, Gd2O3, and Lu2O3 are reported. The static characteristics (current-voltage, capacitance-voltage) and dynamic characteristics (transient characteristics, diagrams of oscillatory regimes) of the structures before and after irradiation with doses D=104–106 rad are examined. It is found that the irradiation dose D=106 rad does not produce any substantial degradation of the characteristics of the structures. The radiation-induced changes observed in the experimental samples are consistent with existing data for MIS structures with SiO2 as the insulator.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1134/1.1187085
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