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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Surface Science Letters 223 (1989), S. A583-A584 
    ISSN: 0167-2584
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Surface Science 223 (1989), S. 213-232 
    ISSN: 0039-6028
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 0042-207X
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Electron Spectroscopy and Related Phenomena 46 (1988), S. 131-143 
    ISSN: 0368-2048
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 18 (1992), S. 403-411 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Much controversy in the literature is associated with the definitons of terms describing electron transport in solids, i.e. the inelastic mean free path, the attenuation length, the escape depth, etc. This may cause some confusion in determining the corresponding correcting factors for calculations of quantitative AES. There are indications that the proper parameter for the correcting procedure is the inelastic mean free path (IMFP). None the less, difficulties may be encountered in estimating the values of the IMFP for studied samples, particularly for binary or multicomponent systems.A novel procedure of quantitative analysis is proposed in which knowledge of the IMFP is no longer necessary. Actually, the correction procedure normally used requires the ratio of the IMFP for the sample and the standard. One can take advantage of the fact that the IMFP is related to the absolute elastic peak intensity. In that case, determination of the ratio of elastic peak intensities for the sample and the standard makes possible calculation of the ratio of the IMFP. Inasmuch as the measurements of the absolute elastic peak intensities offer considerable experimental difficulties, the determination of the ratio of intensities is relatively easy to perform. Thus, recording the ratio of elastic peak intensities, in addition to the ratio of Auger electron intensities, provides complete information for the correction procedure of quantitative analysis. Such a procedure has two important advantages: the ratio of the IMFP is determined for the studied samples instead of taking these values from the literature, and the actual concentration dependence of the IMFP is accounted for. The calibration plots facilitate recalculation of the ratio of elastic peak intensities to the ratio of the IMFP. Somewhat lengthy calculations are necessary to determine such a plot; however, they are made only once for a given alloy. Application of the proposed method of quantitative analysis is illustrated by using the AuPd alloys.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 26 (1998), S. 400-411 
    ISSN: 0142-2421
    Keywords: inelastic mean free path ; elastic peak electron spectroscopy ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Theoretical values of the inelastic mean free path (IMFP) and their electron-energy dependence are available in the literature from predictive formulae for various categories of materials, such as elemental solids, inorganic and organic compounds. in contrast, the experimental IMFP values were determined for a more limited number of materials. This refers especially to multicomponent solids.We have measured the IMFP dependence on energy for Cu and two copper oxides, CuO and Cu2O, using elastic peak electron spectroscopy. The experiment consisted of measuring the backscattering probabilities for the investigated materials and an Ni standard in the energy range 400-1600 eV. The IMFP values were determined using a theoretical model describing the phenomenon of elastic backscattering. The IMFP values determined in this work are in reasonable agreement with experimental and theoretical values published in the literature. © 1998 John Wiley & Sons, Ltd.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 25 (1997), S. 356-365 
    ISSN: 0142-2421
    Keywords: cobalt ; palladium ; alloys ; Auger electron spectroscopy ; x-ray photoelectron spectroscopy ; surface composition ; surface segregation ; Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Palladium-based alloys and bimetallic systems are of importance in heterogeneous catalysis. Recently, attention was devoted to studies of the catalytic properties of the Co—Pd binary system. An important issue to consider is the surface composition of this alloy. The aim of the present work was to determine the surface composition of the polycrystalline CoPd alloys in a wide range of constituent concentrations (Co30Pd70 at.%, Co50Pd50 at.% and Co70Pd30 at.%) at temperatures up to 900°C. Quantitative AES and XPS analyses were used for this purpose. To determine the surface composition, the values of the inelastic mean free path (IMFP) for the studied alloys are necessary. These were derived from the elastic peak intensity. The reported values of the IMFP for Pd are in agreement with the data available in the literature. Reasonable consistency of the IMFP values for CoPd alloys and Co was also observed. The surface compositions of the CoPd alloys at room temperature determined by AES and XPS are in good agreement. It has been found that Pd segregates to surfaces of the Co30Pd70 and Co50Pd50 alloys at temperatures above 300°C. © 1997 John Wiley & Sons, Ltd.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
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  • 8
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Interaction of carbon compounds with transition metal surfaces results, under appropriate conditions, in the formation of a number of carbon-containing species of different character. In the present work, the pattern recognition method (the k-nearest neighbour rule) together with AES was applied to study the carbonaceous residues after adsorption of acetylene and ethylene at the surface of polycrystalline nickel and platinum. The above method identifies the residues by comparison to different samples of polyacetylenes. Identification is based on analysis of the KLL Auger spectra shape recorded for carbon atoms. As hypothetical oligomers, polyacetylenes with different conjugation lengths were chosen (7-105 Å). The applied method confirmed that ethylene and acetylene oligomerize at the nickel surface. Carbonaceous residues were recognized as the polyacetylenes with the longest conjugation lengths (105 Å). At the platinum surface the oligomerization process was also observed, but to a much smaller extent (average conjugation length equal to 15 Å).
    Additional Material: 8 Ill.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 21 (1994), S. 724-730 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: An efficient method for quantitative XPS analysis is the so-called multiline approach. This method does not require standards, it takes into account the instrumental and matrix effects and it derives quantitative information from statistical analysis of all photoelectron intensities visible in the spectra. One can expect the reliability of this approach to be better than the reliability of methods involving uncorrected relative sensitivity factors. This paper summarizes recent improvements in the multiline approach. In particular, a new expression for the universal energy dependence of the inelastic mean free path is currently used. Furthermore, the statistical analysis has been modified in order to account properly for the error in the countrates. Finally, a database with physical constants has been added (photoionization cross-sections, asymmetry parameters, binding energies, etc.) to avoid errors of polynomial approximations. The modified algorithm of the multiline approach was applied to photoelectron intensities measured for AuCu alloys in four laboratories. Surfaces of these alloys were sputtered with 2 keV Ar+ ions, because at this energy the selective sputtering effects are expected to be negliible. Very consistent results were obtained. The average deviation from the bulk surface composition was found to be equal to ±3.2 at.%. Extensive software implementing the described version of the multiline approach is presently being developed.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 12 (1988), S. 461-467 
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The aim of the work was to verify the possibility of application of Auger electron spectroscopy in connection with the pattern recognition method to study the polymer surfaces. Synthetic metals were chosen for investigation. The carbon KLL spectra were analysed using the so-called k-nearest neighbour rule. Analysis was performed for polyacetylene and polypyrrole doped with Fe(CN)64- and FeCl4- ions. On the basis of the standard spectra recorded for all polymers the effective recognizing procedure was developed. Noticeable changes of spectra were observed on electrochemical removal of dopants. The analysis made after 90 days of ageing in vacuum revealed some spectra changes in doped polymers. These change may be due to the disappearance of dopants or to the deposition of contaminants. An electron beam of 300 nA at 1000 eV was found to affect the surface of polyacetylene.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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