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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 103 (1995), S. 7187-7196 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Atom desorption from the (0001) surface of a HCP single crystal Zr induced by 2 keV Ne+, Ar+, and Xe+ ions at four incident angles is studied using molecular dynamics simulations. The atom ejection pattern for normal ion incidence has six approximately equal intense spots around a weak central spot, in agreement with the pattern observed experimentally. Few surface atoms have a high probability of being sputtered and they contribute significantly to the formation of the intense spots. The mechanism for the formation of the spots is determined primarily by the first two layers of the crystal and knock-on sputtering by primary recoil is important for all three ions. The relative importance of primary recoil knock-on ejection increases with ion mass. Other mechanisms involve momentum transfer through second layer atoms. The Lehmann–Sigmund mechanism is not applicable for the ion masses and energies used in the simulations. Similarities and differences between the HCP (0001) and FCC (111) surfaces are discussed and it is proposed that, to a certain extent, the atom ejection mechanisms described in this paper may also apply to FCC (111) surfaces under similar sputtering conditions. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 98 (1993), S. 5887-5898 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Ion beams with energies in the range 1–2 keV are used to sputter neutral Zr atoms from a polycrystalline surface. Laser induced fluorescence detection is used to obtain angular distributions of sputtered neutrals as a function of ion impact direction, ion mass, ion energy, and spin–orbit state of the exiting atoms. About 40% of the sputtered atoms are excited. Angular distributions depend weakly on ion mass and energy. The angular distributions are fitted well by a modified form of the Roosendaal and Saunders model of sputtering.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 452-459 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An apparatus utilizing laser-induced fluorescence (LIF) has been developed to measure high-resolution angular distributions of sputtered neutral atoms. LIF provides sensitive detection, a feature necessary to monitor the low atomic fluxes inherent to angularly resolved sputtering measurements in the static sputtering regime. The apparatus incorporates a detector assembly which rotates about the sample in an ultrahigh vacuum (UHV) chamber, allowing a large range of angular measurements at different ion beam incidence angles. Laser light is brought to the detector in the UHV chamber via a single optical fiber and fluorescence photons exit the chamber via a fiber bundle. The optical fiber and fiber bundle are mounted in a fixed orientation on the detector, maintaining constant alignment as the assembly rotates. Angular resolution in the polar plane containing the incident ion beam and the surface normal is better than 3°. Angular resolution in the direction perpendicular to the polar plane is governed by the Doppler shift and is 0.028° for 3.2 eV atoms. Overall detection efficiency is estimated to be 5×10−9 counts per sputtered atom and 2×10−3 counts per atom entering the detection volume. Initial experiments using polycrystalline Zr to characterize the device are described.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    New York, NY : Wiley-Blackwell
    Proteins: Structure, Function, and Genetics 31 (1998), S. 445-452 
    ISSN: 0887-3585
    Keywords: chorismate mutase ; activity ; allosteric ; electrostatics ; Chemistry ; Biochemistry and Biotechnology
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Medicine
    Notes: The predicted active site of chorismate mutase of baker's yeast Saccharomyces cerevisiae has been studied by continuum electrostatics, molecular surface/volume calculations, and molecular modeling. Our study shows that despite being subject to an allosteric transition, the enzyme's active-site pocket neither decreased in volume nor deformed significantly in shape between the active R state and the inactive T state. We find that the polar atmosphere in the pocket is responsible for the enzyme's affinity. A single amino acid, Glu23, can adequately account for the atmospheric variation. This residue swings into the active-site pocket from the R state to the T state. In the R state, Glu23 on helix H2 doubly pairs with Arg204 and Lys208 of H11, which is packed against H2. In the T state, a slide occurs between H11 and H2 such that Glu23 can no longer interact with Lys208 and competes with Asp24 for interacting with Arg204. Consequently, Glu23 is found in the T state to couple with Arg157, an active-site residue critical to substrate binding. The tandem sliding of H11 in both monomers profoundly changes the interactions in the dimer interface. The loop between H11 and H12 demonstrates the largest conformational change. Hence, we establish a connection between the allosteric transition and the activity of the enzyme. The conformational change in the transition is suggested to propagate into the active-site pocket via a series of polar interactions that result in polarity reversal in the active-site pocket, which regulates the enzyme's activity. Proteins 31:445-452, 1998. © 1998 Wiley-Liss, Inc.
    Additional Material: 5 Ill.
    Type of Medium: Electronic Resource
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