ISSN:
1435-1536
Keywords:
Thin films
;
self-assembly
;
polyelectrolyte
;
ellipsometry
;
optical anisotropy
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Self-assembly of polyelectrolytes-polystyrenesulfonate (PSS) and polyallylamine (PAH) with added salts of MnCl and NaBr was studied by x-ray reflectometry and ellipsometry technique. The thickness of PSS-PAH bilayer was measured to be 5.1±0.2 nm according to reflectometry and 6.1±0.7 nm according to ellipsometry. The discrepancy in data is attributed to the difference in the interaction of the interfaces with x-rays and visible light. The films are found to be rather homogeneous and the deposition process regular. The refraction indices of the deposited films were found to ben 0=1.50±0.05,k 0=0.07±0.05,n e=1.53±0.05k e=0, optical axis being perpendicular to the surface. The values of refractivity characterize the whole film (up to seven bilayers) and do not vary with increasing thickness.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00657788
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