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  • 1
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin Co/Pt multilayers were prepared on Si and glass substrates by sputtering with Ar pressures ranging from 2.5 to 15 mTorr. The bilayer structure of the samples was Co(3 A(ring))/Pt(15 A(ring))×17, and all samples had the easy axis of magnetization perpendicular to the sample surface as determined with a SQUID magnetometer. All samples retained the layered structure, as revealed by low-angle x-ray diffraction. In addition, diffraction peaks due to the formation of Co-Pt compounds (presumably at the interfaces between Co and Pt) were identified. The coercivity of samples changed from about 400 Oe for films deposited at low Ar sputtering pressure (2.5 mTorr) to as high as 2300 Oe for films deposited at high Ar pressure (15 mTorr). Ellipsometry and atomic force microscopy were used to study surface roughness and microstructure of samples prepared at different sputtering pressures.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 5337-5339 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A general expression for the magneto-optical polar Kerr effect is given for a bilayered configuration in which the optical constants of the two media differ. The equation shows that a giant enhancement of the Kerr effect in magneto-optical/metallic bilayers can be expected if the dielectric constants of the two materials are low or are matched well to the other. An explicit equation is also given to calculate the spectral enhancement due to a dielectric overcoating on magnetic substrates. An example is given for SiO-coated Dy/Co compositionally modulated alloys, yielding a good comparison to the experimental results in both the transparent and absorbing spectral regions of SiO.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 1362-1373 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Exact expressions are presented for the deflection of a laser beam passing parallel to and above the surface of a sample heated by a periodically modulated axisymmetric laser beam. The sample may consist of any number of planar films on a thick substrate. These exact expressions are derived from a local Green's function treatment of the heat conduction equation, and contain an exact analytical treatment of the absorption of energy in the multilayered system from the heating laser. The method is based on calculation of the normal component of the heat fluxes across the layer boundaries, from which either the beam deflections or the temperature anywhere in space can be easily found. A central part of the calculation is a tridiagonal matrix equation for the N+1 normal boundary fluxes, where N equals the number of films in the sample, with the beam deflections given as simple functions of the normal heat flux through the top surface of the sample. Even though any layer or layers in the sample (including the substrate) can be optically absorbing, the final results are remarkably simple both in form and ease of calculation, even for large numbers of layers. In the case of an infinitesimal probe beam, the beam deflections are given by an expression involving a single numerical integration which can be eliminated for data analysis by Fourier transforming the experimental data. A general expression for the measured signals for the case of four-quadrant detection is also presented and compared to previous calculations of detector response for finite probe beams.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4801-4802 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have applied the technique of variable angle of incidence spectroscopic ellipsometry (VASE) to the analysis of multilayered magneto-optic structures. With this instrument we measure the complete pseudodielectric tensor (diagonal and off-diagonal elements) for the sample of interest at variable angles of incidence. We have also developed computer software to perform a best-fit analysis of the measured data, providing optical constants, Voigt parameters, and layer thicknesses for the individual layers in the sample. Additionally, given an estimate of the material parameters, this software will provide an estimate of the optimum spectral range and angles of incidence for accurate characterization of the sample. An example of the above is given for a series of thicknesses of Dy/Co compositionally modulated multilayers deposited on a thick silver layer and subsequently overcoated with a thick layer of SiO. Results confirm the predicted optimum range of accuracy for this material system and effectively delineate the useful spectral range of this technique.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Amorphous Tb/Co compositionally modulated films were deposited on Si substrates with different modulation layer thicknesses ranging from about 2.5 to 15 A(ring). The nominal Tb to Co layer thickness ratios were systematically varied and the complex refractive index (n and k) and polar magneto-optical Kerr effects (rotation and ellipticity) were measured in the 3000–8000-A(ring) spectral range as well. The samples were divided into two groups. In one group, the thickness of the Co layers was fixed, the Tb layer thickness varied. In the second group, the thickness of the Tb layer was fixed, and that of the Co layer thickness varied. The Kerr rotation and the coercivities of the samples showed very consistent and interesting changes. X-ray diffraction and x-ray fluorescence were also performed on the samples, which revealed layered structures, or compositional modulation, and provided information on the Tb to Co atomic ratios in the samples.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 4021-4028 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin and ultrathin Co/Pt multilayered structures have been prepared on glass substrates by electron-beam evaporation at room temperature and by sputtering at various substrate temperatures and sputtering pressures. Perpendicular magnetic anisotropy was found in samples with Co/Pt bilayer thicknesses near 3 A(ring)/10 A(ring) and total thicknesses of the layer stack of no greater than 300 A(ring). X-ray diffraction was performed on the samples to determine layer spacing and integrity, and possible crystallinity of films. Crystalline structures in the interface between the Co and Pt layers were found and identified. The effects of sputtering parameters, such as pressure and substrate temperature, on the magneto-optical Kerr effect were studied. The two deposition methods, electron-beam evaporation and sputtering, resulted in different magneto-optical properties in samples with the same nominal layer structures. We have also investigated optical properties (reflectance, index of refraction, and extinction coefficient) of these materials using ellipsometry.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of TbFeCo films ranging in thickness from 100 to 800 A(ring) have been deposited in trilayer structures on silicon wafer substrates, with Si3N4 being employed as the dielectric material. These films have been characterized both optically and magneto-optically by variable angle of incidence spectroscopic ellipsometry, normal angle of incidence reflectometry, and normal angle of incidence Kerr spectroscopy. From these measurements, the optical constants n and k have been determined for the TbFeCo films, as well as the magneto-optical constants Q1 and Q2. Results are presented that demonstrate the lack of dependence of these constants on the thickness of the TbFeCo film, and which can be used for calculating the expected optical and magneto-optical response of any multilayer structure containing similar TbFeCo films.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2479-2481 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 5769-5769 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The purpose of this paper is twofold. First, we describe the adaptation of a variable angle spectroscopic ellipsometer (VASE) to magneto-optic measurements covering 3000–8000 A(ring), and 0 to ±8 kOe. Second, we describe application of VASE to determine Kerr rotation and ellipticity for a series of Dy/Co multilayers prepared by sputter deposition. We report spectroscopic ellipsometric and Kerr effect results for samples exhibiting perpendicular magnetic anisotropy, since these are relevant as magneto-optic recording media.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 7547-7555 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Detailed and practical expressions are given for the magneto-optical Kerr effect (MOKE) for various configurations of two media. One is a magneto-optic (MO) one, and the other is a nonmagnetic (NM) medium. For a system of two thick media with a single interface, with a first-order approximation in MOKE term Q, the Kerr function is determined by the product of a MOKE term Q and an optical term η. A second type of system includes a thin MO (or NM) layer deposited on a thick NM (or MO) substrate. For a MO/(NM-substrate) configuration, the Kerr function is related to the Kerr effects from the air/MO and MO/NM interfaces, and to the Faraday effects of the MO layer, as well as to interference effects. The enhancement factor can be expected to be large by proper choice of materials. For a NM/(MO-substrate) configuration, the total Kerr function is related to the Kerr effect from the NM/MO interface and can be enhanced by interference. The enhancement factor is expected to be less than one if the NM layer is strongly absorbing. Calculations of Kerr effects for examples of the PtMnSb/AuAl2 and Fe/Cu configurations are given. These indicate that the peaks shown in the onset region of the interband transitions of Cu can be attributed to a dramatic change of the refractive index in that region. The merits of a MO/(NM-metallic) structure have been evaluated, and indicate that a better Kerr enhancement effect can be achieved if the refractive index of the MO layer is larger than one and is much larger than that of the metallic material. A drawback to this configuration comes from the fact that a MO material with a large refractive index value usually is not expected to have a large intrinsic Kerr effect.
    Type of Medium: Electronic Resource
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