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  • 1
    Electronic Resource
    Electronic Resource
    Thin-film hermeticity: A quantitative analysis of diamondlike carbon using variable angle spectroscopic ellipsometry (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 4175-4180 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The purpose of this paper is twofold. First, we report on the successful application of variable angle spectroscopic ellipsometry to quantitative thin-film hermeticity evaluation. Secondly, it is shown that under a variety of film preparations and moisture introduction conditions water penetrates only a very thin diamondlike carbon (DLC) top surface-roughness region. Thus DLC is an excellent candidate for use as protective coatings in adverse chemical and aqueous environments.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341331
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  • 2
    Electronic Resource
    Electronic Resource
    Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 3407-3410 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Optical constants (3000–8000 A(ring)) and layer thicknesses of TiO2/Ag/TiO2 optical coatings are determined using variable angle of incidence spectroscopic ellipsometry. Ellipsometrically determined silver layer thicknesses agree well with those obtained by cross-sectional transmission electron microscopy. Also, spectral characteristics, absent in bulk silver data, are observed in n and k spectra for the thin silver layers. It is suggested that these structures may be caused by plasmon effects from the silver layers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.342491
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  • 3
    Electronic Resource
    Electronic Resource
    Optical properties of ion-beam-deposited ion-modified diamondlike (a-C:H) carbon (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 2611-2616 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Diamondlike carbon (DLC) is a hard, semitransparent material usually containing varying amounts of hydrogen. These materials have numerous potential applications, including use as coatings for infrared optics, and as such, the effects of damaging irradiation is of practical interest. In this paper we present results of variable angle spectroscopic ellipsometric (VASE) studies of ion-beam-deposited DLC films. These films have been further modified by directing 1-MeV gold ions, as well as 6.4-MeV fluorine ions, through the DLC and into the underlying silicon substrates, and the percentage of hydrogen in the film was measured versus fluence using proton recoil analysis. Optical analysis was performed assuming the Lorentz oscillator model. Three versions were used: one oscillator, two oscillator (with one fixed in energy), and two oscillator with all parameter variable. The latter model fits the VASE data extremely well, and the two oscillators can be interpreted as involving π to π* and σ to σ* band transitions. With ion modification the oscillators shift to lower photon energy, consistent with reduction in hydrogen concentration and possible increased graphitization.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341651
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  • 4
    Electronic Resource
    Electronic Resource
    Enhanced magneto-optic Kerr effects in thin magnetic/metallic layered structures (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 2479-2481 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Enhanced Kerr rotation spectra are measured in thin magnetic layers on silver. Also, variable angle of incidence spectroscopic ellipsometry is employed to measure the optical dielectric function of both the thin magnetic layer and the underlying thick silver layer. These results are explained quantitatively using the electromagnetic theory for reflection of light from multiple layers of isotropic and gyrotropic materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102004
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  • 5
    Electronic Resource
    Electronic Resource
    Highly oriented Tl2Ba2Ca2Cu3O10 thin films by pulsed laser evaporation (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 760-762 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have fabricated superconducting thin films on MgO(100) substrates with nearly pure Tl2Ba2Ca2Cu3O10 (2:2:2:3) phase using pulsed laser evaporation and post-annealing. The films had c axes perpendicular to the substrates. Superconducting films with onset temperatures of 125 K and zero resistance at 110 K were obtained. X-ray microprobe fluorescence measurements indicate that a typical composition of films is Tl0.66Ba1.77Ca1.46Cu3Ox, which is low in Tl compared to that expected for the 2:2:2:3 phase. A typical grain size is greater than 10 μm as revealed by scanning electron microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101473
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  • 6
    Electronic Resource
    Electronic Resource
    Optical constants of GaxIn1−xP lattice matched to GaAs (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3416-3419 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The optical constants of Ga0.51In0.49P have been determined from 0.8 to 5.0 eV using variable-angle spectroscopic ellipsometry measurements at room temperature. The metal-organic vapor-phase-epitaxy-grown samples were x-ray analyzed to confirm lattice matching to the GaAs substrate. The effects of the native oxide were numerically removed from the data to determine the intrinsic optical constants. This is important because the optical constants reported become generally useful for modeling multiple-layer structures. A Kramers–Kronig analysis was used to reduce interference-related fluctuations in the below-gap refractive index. Near the band edge a mathematical form for excitonic absorption was included. Critical point energies were extracted using a numerical second-derivative fitting algorithm. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358632
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  • 7
    Electronic Resource
    Electronic Resource
    Preparation of high Tc Tl-Ba-Ca-Cu-O thin films by pulsed laser evaporation and Tl2O3 vapor processing (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 1810-1811 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tl-Ba-Ca-Cu-O superconducting thin films with zero-resistance temperatures up to 115 K have been prepared using a Tl2 O3 vapor process on Ba-Ca-Cu-O precursor thin films. The Ba-Ca-Cu-O thin films were made by laser deposition on Y-stabilized ZrO2 substrates. This technique minimizes problems caused by the toxicity of Tl2 O3, and its subsequent decomposition to the volatile and toxic Tl2 O upon heating. Therefore, it may have practical application in the fabrication of high Tc Tl-Ba-Ca-Cu-O superconducting thin-film devices.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101493
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  • 8
    Electronic Resource
    Electronic Resource
    In situ and ex situ optical characterization of electro deposited magneto-optic materials : The 40th annual conference on magnetism and magnetic materials (1996)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 6193-6195 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electrodeposition is being investigated as a novel and low-cost method to prepare magneto-optic thin film and nanostructured materials. This deposition method allows precise control over thin-film properties and permits deposition of novel magnetic geometries. Multilayers and alloys can be deposited and controlled by adjusting deposition potentials and ion concentrations in the bath. Nickel/cobalt alloys have been electrodeposited from sulfamate, sulfate, and chloride solutions onto Au substrates. The optical properties were monitored in situ with a real-time spectroscopic ellipsometer measuring simultaneously at 44 wavelengths in the 410–750 nm spectral range. In situ measurements have the advantage of determining the material microstructural properties (thickness, density, and roughness) before the films are oxidized in the air ambient. Ex situ variable angle spectroscopic ellipsometry measurements were taken over the spectral range from 205 to 1000 nm. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.362069
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  • 9
    Electronic Resource
    Electronic Resource
    Nanostructural effects and interface magnetism in Co/Pd multilayers : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 5954-5956 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of Co/Pd multilayers were made by dc magnetron sputter deposition on Al foil substrates. For these multilayered samples, Co layer thicknesses were less than 4 A(ring) and Pd layers were varied from 4 to 22 A(ring). Sputtering rates were controlled by either sputtering power (10–50 W) or Ar sputtering pressure (3–15 mTorr). In both cases, lower deposition rates yielded higher perpendicular coercivity up to 2.6 kOe. Structures of the samples were studied using conventional θ-2θ x-ray diffractometry (XRD). It has been found that magnetic properties such as coercivity and saturation magnetization are sensitive to interfacial structures. A nanostructural model including interfacial parameters such as alloy layer composition is discussed and compared with the magnetization data. Both XRD and magnetization measurements show that the interfaces become more diffuse at higher sputtering pressures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353482
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  • 10
    Electronic Resource
    Electronic Resource
    Kerr effect of two-medium layered systems (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 7547-7555 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Detailed and practical expressions are given for the magneto-optical Kerr effect (MOKE) for various configurations of two media. One is a magneto-optic (MO) one, and the other is a nonmagnetic (NM) medium. For a system of two thick media with a single interface, with a first-order approximation in MOKE term Q, the Kerr function is determined by the product of a MOKE term Q and an optical term η. A second type of system includes a thin MO (or NM) layer deposited on a thick NM (or MO) substrate. For a MO/(NM-substrate) configuration, the Kerr function is related to the Kerr effects from the air/MO and MO/NM interfaces, and to the Faraday effects of the MO layer, as well as to interference effects. The enhancement factor can be expected to be large by proper choice of materials. For a NM/(MO-substrate) configuration, the total Kerr function is related to the Kerr effect from the NM/MO interface and can be enhanced by interference. The enhancement factor is expected to be less than one if the NM layer is strongly absorbing. Calculations of Kerr effects for examples of the PtMnSb/AuAl2 and Fe/Cu configurations are given. These indicate that the peaks shown in the onset region of the interband transitions of Cu can be attributed to a dramatic change of the refractive index in that region. The merits of a MO/(NM-metallic) structure have been evaluated, and indicate that a better Kerr enhancement effect can be achieved if the refractive index of the MO layer is larger than one and is much larger than that of the metallic material. A drawback to this configuration comes from the fact that a MO material with a large refractive index value usually is not expected to have a large intrinsic Kerr effect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345818
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