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  • 1
    Electronic Resource
    Electronic Resource
    Status of the Brookhaven National Laboratory high current electron beam ion source test stand : The 8th international conference on ion sources (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 893-895 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: As part of a new, compact heavy ion injector for the AGS/RHIC complex at Brookhaven National Laboratory we are developing an electron beam ion source (EBIS) that would satisfy present and future requirements. Such a source should be capable of producing intensities of, e.g., Au35+ ions of about 3×109 particles/pulse or U45+ of about 2×109 particles/pulse. To achieve this, the required e-beam intensity is 10 A, at a pulse length of 100 ms. An EBIS test stand has been constructed, designed for the full electron beam power and having close to 1/2 of the trap length of an EBIS for RHIC. Initial electron beam tests have resulted in a 50 μs, 13 A electron beam. Ion production and extraction has been shown with a 3.1 A, 50 ms electron beam, achieving an ion yield of 19 nC/pulse (neutralization degree of 61%); fast extraction trials have yielded extracted ion pulses of 1 mA peak current and 18 μs at FWHM. Details of the test stand construction, results of the electron beam studies, and properties of the extracted ion pulse are presented. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1150324
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  • 2
    Electronic Resource
    Electronic Resource
    Vacuum separation of the ionization volume from the cryostat insulating volume in the Stockholm cryogenic electron-beam ion source : Proceedings of 5th international conference on ion sources (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1061-1062 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The main goal of this project was to increase the reliability of CRYSIS by separating the ionization region from the insulating volume which contains vacuum seals at the cryostat. These volumes are separated with two bellow units installed between the cryostat and both ends of the vacuum vessel. The bellow units contain drift tubes with different fixed temperatures, heat shields, feedthroughs for drift tubes, and a gas delivery tube for gas injection. Preliminary results of tests after CRYSIS vacuum separation are presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145062
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  • 3
    Electronic Resource
    Electronic Resource
    Increased ion intensity and reliability of the Stockholm electron beam ion source (abstract)a) : Proceedings of 5th international conference on ion sources (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1132-1132 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The electron beam ion source, CRYSIS, produces highly charged ions for injection into the heavy ion storage ring—CRYRING at MSL, as well as low energy atomic physics experiments and the Stockholm–Mainz Penning trap recently installed at MSL. CRYSIS has produced ions up to Ar18+ and 136Xe52+. Pulsed beams of Ar13+ ions 60 μs in duration have been injected into CRYRING via an RFQ and ions of charge up to 136Xe44+ have been used in atomic physics experiments with pulse duration 10–250 ms. A vacuum separation of the cryostat and ionization volumes has been made. Temperature control and measurement of internal electrodes have increased the gas injection efficiency and reduced the memory effect associated with a cryogenic EBIS. External ion injection has been added as an alternative to neutral gas injection for introducing the species to be ionized to high charge states. Monitoring of the radio frequency noise signal with a spectrum analyzer has aided in the propagation of quiet, high current (450 mA) dc electron beams. These quiet electron beams have been used to produce extracted ion pulses of higher intensities than in previous operation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145035
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  • 4
    Electronic Resource
    Electronic Resource
    A beam line for highly charged ions (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2528-2533 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The design and operation of a beam line for transporting and charge-to-mass selecting highly charged ions extracted from the National Institute of Standards and Technology electron beam ion trap (EBIT) are described. This beam line greatly extends the range of experiments possible at this facility. Using the transport system, pure beams of low-energy, highly charged ions up to Xe44+ have been produced with substantially higher fluxes than previously reported from an EBIT source. Design choices and computer modeling for the various components of the beam line are explained in detail. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147192
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  • 5
    Electronic Resource
    Electronic Resource
    Increased ion intensity and reliability of the Stockholm electron beam ion sourcea) (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 1718-1722 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The electron beam ion source, CRYSIS, produces highly charged ions for injection into the heavy ion storage ring—CRYRING at MSL, as well as low energy atomic physics experiments and the Stockholm–Mainz Penning trap recently installed at MSL. CRYSIS has produced ions up to Ar18+ and 136Xe52+. Pulsed beams of Ar13+ ions 60 μs in duration have been injected into CRYRING via an RFQ and ions of charge up to 136Xe44+ have been used in atomic physics experiments with pulse duration 10–250 ms. A vacuum separation of the cryostat and ionization volumes has been made. Temperature control and measurement of internal electrodes have increased the gas injection efficiency and reduced the memory effect associated with a cryogenic EBIS. External ion injection has been added as an alternative to neutral gas injection for introducing the species to be ionized to high charge states. Monitoring of the radio frequency noise signal with a spectrum analyzer has aided in the propagation of quiet, high current (450 mA) dc electron beams. These quiet electron beams have been used to produce extracted ion pulses of higher intensities than in previous operation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144865
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  • 6
    Electronic Resource
    Electronic Resource
    Experimental results from the Brookhaven National Laboratory test electron beam ion source : Proceedings of the 7th international conference on ion sources (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 640-642 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: At Brookhaven National Laboratory, an Electron Beam Ion Source (EBIS) is operational and has produced charge states such as N7+, Ar16+, and Xe26+ using neutral gas injection. Ions such as Na7+ and Tl41+ have been produced using external ion injection. The BNL EBIS effort is directed at reaching intensities of interest to RHIC, approximately 3×109 particles/pulse which will require EBIS electron beams on the order of 10 A. Pulsed electron beams up to 1.14 A have been produced using a 3 mm LaB6 cathode. Ion yields corresponding to 50% of the maximum trap capacity for electron beams up to 0.5 A have been obtained. The goal for the TestEBIS is to produce a uranium ion charge state distribution peaked at U45+ with 50% of the trap capacity for a 1 A electron beam.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148726
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  • 7
    Electronic Resource
    Electronic Resource
    Simulation of 10 A electron-beam formation and collection for a high current electron-beam ion source : Proceedings of the 7th international conference on ion sources (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 1120-1122 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Presented is a report on the development of an electron-beam ion source (EBIS) for the relativistic heavy ion collider at Brookhaven National Laboratory (BNL) which requires operating with a 10 A electron beam. This is approximately an order of magnitude higher current than in any existing EBIS device. A test stand is presently being designed and constructed where EBIS components will be tested. It will be reported in a separate paper at this conference. The design of the 10 A electron gun, drift tubes, and electron collector requires extensive computer simulations. Calculations have been performed at Novosibirsk and BNL using two different programs, SAM and EGUN. Results of these simulations will be presented. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148714
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  • 8
    Electronic Resource
    Electronic Resource
    Continuous highly charged ion beams from the National Institute of Standards and Technology electron-beam ion trap (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1998-2002 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe our newly modified beam line and present its performance in conjunction with the National Institute of Standards and Technology electron-beam ion trap. We find that, contrary to previously reported results from similar ion sources, the highest intensity time-averaged ion fluxes are achieved by letting the ions boil out of the trap in a continuous stream rather than periodically dumping the trap to produce a pulsed beam. We produced continuous beams of 3.0(6)×106 Xe44+ ions per second and lower flux beams of charge states up to Xe49+. Also, in pulsed mode, we created beams with very high peak flux, over 1010 Xe44+ ions per second.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148087
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  • 9
    Electronic Resource
    Electronic Resource
    An EBIS/RFQ−Injector for a cancer therapy synchrotron : Proceedings of the fourth International Conference on Ion Sources (1992)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 2812-2814 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The electron beam ion source (EBIS) is an intense source of bare nuclei of light elements (C,N,O,Ne) for short pulses. A fast extraction time of 4 μs allows advantageous single turn injection into a medically dedicated synchrotron. Since the EBIS can provide bare nuclei of all light ions, it combines favorably with a 1.8 m long radio-frequency-quadrupole accelerator (RFQ) as the only LINAC needed for an injection energy of 1 MeV/u. The required intensity of 108 ions per pulse in 1 s is easily exceeded by a factor of 10 to compensate for beam losses. The technology of an EBIS with an electron current of 165 mA at 3 keV and 50 A/cm2 is well established and has proven to be very reliable for synchrotron injection over many years in Dubna, Saclay, and Stockholm. The low duty factor (10−4) of the RFQ, where 250 kW pulses of rf power will be applied for 25 μs, eliminates the need for cooling. Therefore a four-rod structure may be put on ceramic stands, biased with a negative high voltage to avoid high voltage on the source. The combination of an EBIS with a short RFQ may be considered as the least complex and most reliable injector solution for filling a cancer therapy synchrotron with fully stripped light ions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142813
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  • 10
    Electronic Resource
    Electronic Resource
    Brookhaven National Laboratory electron beam test stand : Proceedings of the 7th international conference on ion sources (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 697-699 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The main purpose of the electron beam test stand (EBTS) project at the Brookhaven National Laboratory is to build a versatile device to develop technologies that are relevant for a high intensity electron beam ion source (EBIS) and to study the physics of ion confinement in a trap. The EBTS will have all the main attributes of EBIS: a 1-m-long, 5 T superconducting solenoid, electron gun, drift tube structure, electron collector, vacuum system, ion injection system, appropriate control, and instrumentation. Therefore it can be considered a short prototype of an EBIS for a relativistic heavy ion collider. The drift tube structure will be mounted in a vacuum tube inside a "warm" bore of a superconducting solenoid, it will be at room temperature, and its design will employ ultrahigh vacuum technology to reach the 10−10 Torr level. The first gun to be tested will be a 10 A electron gun with high emission density and magnetic compression of the electron beam. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148465
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