ISSN:
1573-4854
Keywords:
porous silicon
;
Raman spectroscopy
;
morphology
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Raman-light scattering in porous silicon samples with oriented quantum wires was studied. It was shown, that the experimental data depends on the type of organization of wire system. The explanation of observed effect is discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1009632114501
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