Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
75 (1994), S. 4470-4474
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Dynamic ion-beam mixing (i.e., simultaneous ion irradiation and layer deposition), allowing better control of intermixing and stoichiometry than conventional mixing methods, has been simulated by a Monte Carlo method. Reasonable agreement between simulation and measurements for the systems TiNSi and TiNFe was achieved.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.355935
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