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  • 1
    Electronic Resource
    Electronic Resource
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 527-529 (Oct. 2006), p. 1461-1464 
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A variety of silicon carbide (SiC) detectors have been developed to study their sensitivity,including Schottky photodiodes, p-i-n photodiodes, avalanche photodiodes (APDs), and singlephoton-counting APDs. Due to the very wide bandgap and thus extremely low leakage current, SiCphoto-detectors show excellent sensitivity. The specific detectivity, D*, of SiC photodiodes aremany orders of magnitude higher than the D* of other solid state detectors, and for the first time,comparable to that of photomultiplier tubes (PMTs). SiC APDs have also been fabricated to pursuethe ultimate sensitivity. By operating the SiC APDs at a linear mode gain over 106, single photoncountingavalanche photodiodes (SPADs) in UV have been demonstrated
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 1469-1476 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thermal oxidation of single-crystal p-type CdTe has been carried out in dry and wet oxygen. The thickness of the oxide varies as the square root of oxidation time, implying a diffusion controlled process. The activation energy for thermal oxidation is 1.2 eV. Examination of the oxide by Auger electron spectroscopy, x-ray photoelectron spectroscopy, and transmission electron microscopy shows that the composition of thick layers is CdTeO3; thin layers less than 100 A(ring) thick may differ slightly in composition. An oxygen gradient is detected in as-grown thin oxides, but with storage in air at room temperature the oxygen gradient disappears. Values of chemical shift of the x-ray photoelectron spectroscopy peaks for the cadmium-tellurium-oxygen ternary system are clarified.
    Type of Medium: Electronic Resource
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