ISSN:
1572-9559
Keywords:
ellipsometry
;
far infrared
;
convergent beam
;
inverse problem
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract Development of an ellipsometry to the case of a coherent far infrared irradiation, low temperatures and small samples is described, including a decision of the direct and inverse problems of the convergent beam ellipsometry for an arbitrary wavelength, measurement technique and a compensating orientation of cryostat windows. Experimental results are presented: for a gold film and UBe13 single crystal at room temperature (λ=119Μm), temperature dependencies of the complex dielectric function of SrTiO3 (λ=119, 84 and 28Μm) and of YBa2Cu3O7−δ ceramic (A=119Μm).
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF02086222
Permalink