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  • 1
    Electronic Resource
    Electronic Resource
    Robust Design of Basic Low Voltage CMOS Transconductors (1999)
    Springer
    The journal of VLSI signal processing systems for signal, image, and video technology 22 (1999), S. 87-102 
    Details
    ISSN: 1573-109X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Two new low voltage transconductors are introduced and the statistical design of these transconductors are presented. The circuits operate in the saturation region with fully balanced input signals. Initial circuit simulation results are given. Response surface methodology and design of experiment techniques are used as statistical VLSI design tools together with the statistical MOS (SMOS) model. The response surfaces obtained for the two transconductors show the trade-off between area and functional yield. Using these contours, the designer will be able to estimate the functional yield of the circuits before fabrication. The contours also provide information regarding which transistor aspect ratios are to be altered to achieve a better functional yield.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008139005510
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Editorial (1999)
    Springer
    The journal of VLSI signal processing systems for signal, image, and video technology 22 (1999), S. 83-85 
    Details
    ISSN: 1573-109X
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008177904601
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    Editorial (1999)
    Springer
    Analog integrated circuits and signal processing 20 (1999), S. 171-174 
    Details
    ISSN: 1573-1979
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008362814171
    Library Location Call Number Volume/Issue/Year Availability
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    Paper (German National Licenses)
    Fulltext
  • 4
    Electronic Resource
    Electronic Resource
    Robust Design of Basic Low Voltage CMOS Transconductors (1999)
    Springer
    Analog integrated circuits and signal processing 20 (1999), S. 175-191 
    Details
    ISSN: 1573-1979
    Keywords: roboust design ; low voltage ; yield enhancement ; design of experiments ; response surface methodology
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract Two new low voltage transconductors are introduced and the statistical design of these transconductors are presented. The circuits operate in the saturation region with fully balanced input signals. Initial circuit simulation results are given. Response surface methodology and design of experiment techniques are used as statistical VLSI design tools together with the statistical MOS (SMOS) model. The response surfaces obtained for the two transconductors show the trade-off between area and functional yield. Using these contours, the designer will be able to estimate the functional yield of the circuits before fabrication. The contours also provide information regarding which transistor aspect ratios are to be altered to achieve a better functional yield.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008358115079
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 5
    Electronic Resource
    Electronic Resource
    Statistical Design of Low Power Square-Law CMOS Cells for High Yield (2000)
    Springer
    Analog integrated circuits and signal processing 23 (2000), S. 237-248 
    Details
    ISSN: 1573-1979
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology
    Notes: Abstract A robust design of low voltage low power square law CMOS composite cells using statistical VLSI design techniques is presented. Since random device/process variations do not scale down with feature size or supply voltage, the statistical design of low voltage circuits is essential in order to keep functional yields of low voltage circuits at levels that are competitive and cost effective. The Response Surface Methodology and Design of Experiment techniques were used as statistical techniques. This article shows that statistical techniques will result in area/layout optimization which will enhance functional yield of low voltage analog ICs.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1008319604774
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
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