ISSN:
1572-817X
Keywords:
gradient index transitions
;
interference microscopy
;
waveguides
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Physics
Notes:
Abstract We employ interference microscopy to characterize in a direct and local way the graded index transitions at the boundaries of integrated optical elements fabricated by multistep ion-exchange processes, a task not yet possible by other technologies. A particular fabrication method based on purely thermal ion-exchange, which allows local single-mode propagation, is investigated. The refractive-index distribution is modeled on the basis of the linear theory of diffusion and adiabatic transitions of the refractive-index profile. Finally, its validity is analyzed by microinterferometry.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1007087817512
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