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  • 1
    Electronic Resource
    Electronic Resource
    An investigation of surface segregation in magnetron-sputtered NbSi using UPS and AES (1992)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 19 (1992), S. 23-26 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: Films of amorphous NbSi prepared by magnetron sputtering were found to have a higher concentration of silicon at the surface than in the bulk material. In this paper we report on measurements of both ultraviolet photoemission spectroscopy and Auger electron spectroscopy carried out on samples prepared in situ at the UK Synchrotron Radiation Source, Daresbury. Spectr taken immediately after sputter deposition show that the surface is rich in silicon, while following argon ion bombardment the bulk composition is slowly revealed with a much greater concentration of niobium. This is observed by a comparison of the relative heights of peaks in the Auger spectra and by resonance effects and the sharpening of the Fermi edge in the UP spectra. Of particular interest are changes around the metal-insulator transition that occur at approximately 11 at.% niobium.
    Additional Material: 4 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740190108
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    A third-generation Auger microscope using parallel multispectral data acquisition and analysis (1991)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 17 (1991), S. 71-84 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The Design and construction of an ultrahigh vacuum multi-imaging scanning electron microscope is described. The microscope is designed to contain two field electron emission columns and can acquire simultaneous digital images from a 16-channel electron spectrometer, a four-quadrant back-scattered electron (BSE) detector, an Si(Li) x-ray detector, a SEM detector and the current flowing to ground through the sample. Because there is exact spatial registration between corresponding pixels in each of the images, it is possible to use the image set to make quantitative interpretations of the surface and subsurface chemistry. This is done using mathematical manipulations of the image set, together with models for the SEM, BSE and Auger signals. Techniques are described for setting up the alignment and characterizing the field of view and transmission function of the microscope and its spectrometer. Examples of multi-imaging from simple samples are given. The close coupling between the microscope and its control and interpretation computers provides considerable power for the analysis of inhomogeneous surfaces.
    Additional Material: 16 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740170203
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Analysis of Multispectral Microscope Images Using Neural Networks (1996)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 24 (1996), S. 173-180 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In this study, neural networks have been used to classify the clusters in a scatter diagram formed from images in a multispectral set. The use of multispectral images in surface and materials science has been applied to a number of techniques in recent years. The use of neural networks to analyse multispectral Landsat images of the Earth has already been reported, but has not yet been applied in other fields employing multispectral images. The work reported here used two different neural networks: a three-layer neural net with back propagation and a self-organizing map. The results suggest that neural nets can provide a useful addition to the current multispectral analysis procedures in materials and surface science.
    Additional Material: 9 Ill.
    Type of Medium: Electronic Resource
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    Paper (German National Licenses)
  • 4
    Electronic Resource
    Electronic Resource
    Quantifying data from Auger spectra and images (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 266-278 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A method for quantifying Auger spectra and including matrix effects is described. This method corrects iteratively for the effects of electron back-scattering, the inelastic mean free path and atomic density in the sample using established methods. New algorithms have been developed to assist the user interactively with the analysis of spectra collected from surfaces covered by thin films of unknown composition or thickness, or by coverage of another material. Error analysis has been included for both homogeneous and thin film cases. A ‘figure of merit’, used to inform the user if a thin film model of the surface is accurate, is introduced. The algorithms can be implemented on a small microcomputer. Their application to quantitative Auger analysis by multi-spectral imaging is also described. Each point in a set of images has been corrected for the factors that influence the Auger current to arrive at surface compositions at each pixel for each element. Some of the advantages and problems of quantifying Auger images will be outlined. The use of multi-spectral Auger images is seen as a powerful means of identifying surface phases of materials and is given the acronym MULSAM - MULti-Spectral-Auger Mapping.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740110507
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Quantifying data from Auger spectra and images: Corrections (1988)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 11 (1988), S. 633-633 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740111209
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    Paper (German National Licenses)
    Fulltext
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