Library

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    Electronic Resource
    Electronic Resource
    Zero-field spin splitting in In0.52Al0.48As/InxGa1−xAs metamorphic high-electron-mobility-transistor structures on GaAs substrates using Shubnikov–de Haas measurements (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 3132-3134 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Shubnikov–de Haas measurements were carried out for In0.52Al0.48As/InxGa1−xAs metamorphic high-electron-mobility-transistor structures grown on GaAs substrates with different indium contents and/or different Si δ-doping concentrations. Zero-field (B→0) spin splitting was found in samples with stronger conduction band bending in the InGaAs well. It was shown that the dominant spin splitting mechanism is attributed to the contribution by the Rashba term. We found that zero-field spin splitting not only occurs in the ground electron subband, but also in the first excited electron subband for a sample with Si δ-doping concentration of 6×1012 cm−2. We propose that this In0.52Al0.48As/InxGa1−xAs metamorphic high-electron-mobility-transistor structure grown on GaAs may be a promising candidate spin-polarized field-effect transistors. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1476055
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 2
    Electronic Resource
    Electronic Resource
    Measurement of Thermal Diffusivity of Thermal Control Coatings by the Flash Method Using Two-Layer Composite Sample1 (2000)
    Springer
    International journal of thermophysics 21 (2000), S. 535-542 
    Details
    ISSN: 1572-9567
    Keywords: flash method ; thermal contact resistance ; thermal control coatings ; thermal diffusivity ; two-layer composite sample
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The thermal diffusivity of brittle coatings cannot be measured by the flash method directly because of the difficulty of preparing free-standing samples. Adopting the flash method using a two-layer composite sample, it is possible to measure thermal diffusivity if the radiant pulse is well defined and good thermal contact on the interface of the composite sample can be ensured. Using an equilateral trapezoidal pulse of an Nd-glass laser measuring the dimensionless temperature history of the rear face of the sample, we determined the thermal diffusivity of thermal control coatings in the temperature range of 80 to 200°C. The results for different thicknesses of substrate showed that the thermal contact resistance of the interface can be neglected.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1006660318958
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
  • 3
    Electronic Resource
    Electronic Resource
    A Contactless CCD Dilatometer for Foil Materials (1999)
    Springer
    International journal of thermophysics 20 (1999), S. 743-753 
    Details
    ISSN: 1572-9567
    Keywords: CCD ; contactless ; dilatometer ; foil ; thermal expansion
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract A contactless, compact, low-cost dilatometer based on a laser-pulse thermal-conductivity apparatus has been developed to measure the linear thermal expansion of foil materials. The two sample-edge images are projected onto the array of a charge-coupled device (CCD). Changes in sample length are determined from measurements of the corresponding displacements of the sample-edge images focused on the CCD. The dilalometer performance was tested by comparing results of measurements of the thermal expansion for pure copper with published data. The linear thermal expansion of an L-16-type foil of 20-μm thickness, which is a candidate material for thermocontrol layers (in engineering), was measured with the apparatus.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1023/A:1022685927689
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Paper (German National Licenses)
    Fulltext
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...