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  • 1
    Electronic Resource
    Electronic Resource
    Millimeter wave surface resistance of grain-aligned Y1Ba2Cu3Ox bulk material (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 874-879 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report measurements of the millimeter wave surface resistance of grain-aligned YBa2Cu3Ox bulk material grown by a liquid phase process. The measurements were performed by replacing the endplate of a TE011 cylindrical copper cavity with the superconducting sample. Surface resistance was measured for samples with surfaces oriented perpendicular and parallel to the c-axis of the grains. We show that, for the parallel configuration, the surface resistance at 77 K and 80 GHz is typically near 100 mΩ. For a very well-aligned sample with a very low density of Y2BaCuOy precipitates, measured in the perpendicular configuration, the transition width (10%–90%) is about 2 K and the surface resistance is less than 50 mΩ at 88 K. The effect of microstructure on surface resistance is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347326
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  • 2
    Electronic Resource
    Electronic Resource
    Resolution limits of ion milling for fabricating Y1Ba2Cu3Ox nanostructures (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 71 (1992), S. 2461-2463 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A process is described for fabricating 0.23-μm-wide lines in Y1Ba2Cu3Ox thin films where patterns are defined in a commercial, negative tone, epoxy-based resist by masked ion beam lithography and transferred to the superconducting film by argon ion milling. Lines in 80-nm-thick films had the same zero-resistance temperature (89 K) as the starting films, and a critical current density of 0.7×106 A/cm2 at 77 K, representing a threefold reduction from the starting value. A consistent interpretation of these results is that the line consists of a superconducting core 70 nm in width with the critical current density of the starting film and with 80-nm-wide nonsuperconducting sidewalls. The results were reproducible in lines which did not cross outgrowths in the superconducting film.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351112
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  • 3
    Electronic Resource
    Electronic Resource
    Deposition of high quality YBa2Cu3O7−δ thin films over large areas by pulsed laser ablation with substrate scanning (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 7182-7188 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We describe the transport and structural properties of YBa2Cu3O7−δ thin films deposited by pulsed laser ablation with computer-controlled substrate scanning. Films were deposited on LaAlO3 and SrTiO3 substrates covering a 2×3 cm area with thicknesses of 90 and 160 nm. The 90-nm thick films exhibited a thickness variation of ±8%, Tco = 90.7 ± 0.5 K, Jc = 4.8 ± 0.2 × 106 A/cm2 at 77 K, and a surface resistance (corrected for finite thickness) at 75 GHz of 10–12 mΩ at 77 K. For the 160-nm thick films, the thickness variation was 〈5%, Tco = 91.0 ± 0.3 K, Jc=5.4±0.4×106 A/cm2, and corrected surface resistance was 6–10 mΩ. X-ray diffraction showed that the c-axis mosaic in the films is closely related to that of the substrates and that the only in-plane defects are due to the expected twinning in the a-b plane of the film. The c-axis lattice constants were 1.1688±0.0004 nm. The above properties showed a high degree of uniformity across the substrate area and between films from different deposition cycles. The surface resistance values add significantly to the body of results which show that the temperature-scaled values for niobium can be equaled and perhaps surpassed by YBa2Cu3O7−δ.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347611
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  • 4
    Electronic Resource
    Electronic Resource
    Linewidth dependence of critical current density in Y1Ba2Cu3O7 thin-film microbridges (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 1129-1131 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A study of the dependence of the transport critical current density (Jc) on the width of Y1Ba2Cu3O7 thin-film microbridges with widths down to 2 μm has been made. No evidence of edge pinning, which leads to larger Jc's in narrower microbridges, was found. Due to the limitation in resolution of photolithography encountered in common usage, a tapered or radiation damaged edge was always present, which may have introduced a significant error in the cross section and hence in the estimation of Jc. By normalizing the critical current (Ic) to the room-temperature resistance of the microbridge, we can eliminate this mask-defined cross-sectional error.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.106366
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  • 5
    Electronic Resource
    Electronic Resource
    Electron beam flash evaporation for YBaCuO and BiCaSrCuO thin films (1989)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 66 (1989), S. 4903-4908 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: An electron beam flash evaporation technique is described which reproduces the stoichiometry of superconducting YBa2Cu3Ox (123), Bi2CaSr2Cu2Oy (2122), and Bi2Ca2Sr2Cu3Oz (2223) source powders. Films of each material deposited with this technique exhibit zero resistance temperatures of 78 K or above when furnace annealed; 75 K zero temperatures are obtained for 123 films in situ annealed with atomic oxygen at 775 °C. Transport critical current densities are 1×104 A/cm2 in 25-μm stripes patterned from 123 films, and 6×104 A/cm2 in 1-mm stripes of 2122 and 2223 films using a 1-μV/mm measurement criteria. Typical normal state resistivities are 700 μΩ cm for 2122 and 2223 films and 5 mΩ cm for 123 films. The 2122 films are highly textured with the c axis normal to the substrate. All results are for films deposited on MgO.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.343759
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  • 6
    Electronic Resource
    Electronic Resource
    Free states and automorphisms of the Clifford algebra (1975)
    Springer
    Communications in mathematical physics 45 (1975), S. 53-58 
    Details
    ISSN: 1432-0916
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics , Physics
    Notes: Abstract We study automorphisms of the Clifford algebra which map the set of quasi-free states onto itself. We show that they are quasi-free if the one-particle space is infinite dimensional, and give counter examples in finite dimensions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01609865
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  • 7
    Electronic Resource
    Electronic Resource
    Temperature and spectral dependences of persistent photoconductivity in YBa2Cu3O x thin films (1994)
    Springer
    Journal of superconductivity 7 (1994), S. 743-746 
    Details
    ISSN: 1572-9605
    Keywords: Photoconductivity ; high-T c superconductors ; thin films ; spectral dependence
    Source: Springer Online Journal Archives 1860-2000
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Notes: Abstract Temperature and spectral dependences of photoinduced changes of resistance were measured in YBa2Cu3O x thin films with oxygen content ranging as 6.35 〈x 〈 6.75. The absolute value of efficiency of initiation of photoinduced changes decreases with increase in oxygen content, but the position of peaks in the spectral dependence does not change with a change ofx. Temperature dependences of efficiency have an anomaly atT∽220 K, which is present in all the samples studied, and correlates with anomalies observed by other experimental techniques. Qualitatively similar temperature and spectral dependences of efficiency for the samples in both the insulating and metallic phases may be considered as an indication that the persistent photoconductivity effect in YBCO on both sides of the metal-insulator transition has a common origin.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00721656
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