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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Journal of Photochemistry and Photobiology A: Chemistry 67 (1992), S. 279-286 
    ISSN: 1010-6030
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Oxidation of metals 33 (1990), S. 301-308 
    ISSN: 1573-4889
    Keywords: Pb-In alloys ; oxidation ; oxide-inversion layer ; Auger analysis
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The oxidation of several single-phase Pb-In alloys has been studied in air at room temperature using AES (Auger electron spectroscopy) combined with sputter-depth profiling. Alloy samples with indium composition between 3 and 64 at.% In, which were prepared using a microtome, were oxidized in air. The oxidation of alloys with low In contents was found to be the same as that of Pb-2.9 at.% Sn.1 Increasing the bulk composition of In increased the ratio of oxidized In to oxidized Pb in the oxide mixture, although Pb oxide was observed even on the surface of the oxide for samples up to 64 at.% In. The oxidation behavior of Pb-In alloys can be explained in terms of preferential oxidation of In due to its much greater affinity for oxygen than Pb.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    Springer
    Oxidation of metals 36 (1991), S. 465-474 
    ISSN: 1573-4889
    Keywords: Pb-In alloy ; oxidation ; logarithmic and parabolic kinetics ; short-circuit diffusion
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: Abstract The solid-state oxidation kinetics of a Pb-64 at. % In (50 wt. %) single-phase alloy were studied from room temperature to 150°C using an AES (Auger Electron Spectroscopy) depth profiling technique. The general oxidation behavior of this alloy is different from that of a Pb-3 at.% In alloy but similar to that of a Pb-30 at.% In alloy. The oxide formed on this alloy is almost pure In oxide (In2O3) with the possible existence of some In suboxide near the oxide/alloy interface. At room temperature, oxidation of the alloy follows a direct logarithmic law, and the results can be described by the model proposed previously by Zhang, Chang, and Marcotte. At temperatures higher than 75° C, rapid oxidation occurred initially followed by a slower parabolic oxidation at longer time. These data were described quantitatively by the model which assumes the existence of short-circuit diffusion in addition to lattice diffusion in the oxide as proposed by Smeltzer, Haering, and Kirkaldy. The effects of alloy composition on the oxidation kinetics of (Pb, In) alloy are also examined by comparing the data for Pb-3, 30, and 64 at. % In alloys.
    Type of Medium: Electronic Resource
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