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  • 2000-2004  (2)
  • 2000  (2)
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  • 2000-2004  (2)
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  • 1
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 76 (2000), S. 3194-3196 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spectroscopic ellipsometry is applied to determine the oxidation resistance of TiN and CrN coatings. This technique proves to provide accurate measurements of the oxide layer thickness in a convenient, fast, and nondestructive manner. The magnetron-sputtered thin films were heated in air in the temperature range between 673 and 925 K. The verification with scanning electron microscopy and x-ray reflectometry shows an excellent agreement between these complementary techniques. The rate constant k of the oxidation is directly related to the film morphology in TiN thin films. While understoichiometric films with a dense fine-grained structure exhibit a moderate k of 4 nm2/s at 773 K, overstoichiometric films with a pronounced columnar structure oxidized over seven times faster. The nonstoichiometry in TiNy and CrNy leads to a reduced activation energy for oxidation compared to stoichiometric compounds. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Environmental modeling and assessment 5 (2000), S. 75-81 
    ISSN: 1573-2967
    Keywords: modified Gaussian model ; in situ measurements ; model evaluation
    Source: Springer Online Journal Archives 1860-2000
    Topics: Energy, Environment Protection, Nuclear Power Engineering
    Notes: Abstract This paper presents a mathematical model of local pollutant dispersion designed to compute the concentration field above and around the Marcoule nuclear site. The model is based on integrating the classical turbulent diffusion equation, corrected (prior to integration) by experimental wind tunnel data obtained for a scaled-down model of the site. The computed results are compared with full-scale experimental observations at Marcoule in the case of neutral atmosphere. A comparison with the standard Gaussian model is also made. Finally, a critical analysis of the model is presented.
    Type of Medium: Electronic Resource
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