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Digitale Medien

Employee Downsizing Strategies: Market Reaction and Post Announcement Financial Performance (2002)

Chalos, Peter ; Chen, Charles J. P.

Oxford, UK and Boston, USA : Blackwell Publishers Ltd

Journal of business finance & accounting 29 (2002), S. 0

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ISSN: 1468-5957

Quelle: Blackwell Publishing Journal Backfiles 1879-2005

Thema: Wirtschaftswissenschaften

Notizen: Empirical studies have generally reported insignificant market reactions to employee downsizing. In an effort to reconcile ongoing layoffs with inconclusive empirical results, we segregated our sample by downsizing strategy and examined employee layoff announcements made by Fortune 500 firms during the 1993–1995 period. Unlike previous studies, we find a positive market reaction for layoff announcements related to revenue refocusing. Market reaction with respect to layoff announcements involving cost cutting was insignificant while weak evidence was found for a negative market reaction to layoffs related to plant closings. Consistent with the market reaction, post announcement analysis revealed that downsizing in conjunction with revenue refocusing (plant closing) improved (reduced) firm financial performance and that revenue refocusing firms significantly outperformed cost cutting and plant closing firms over the three–year post announcement period.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1111/1468-5957.00453

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Digitale Medien

N-channel power MOSFET for fast neutron detection (2002)

Salame, C. ; Mialhe, P. ; Charles, J.-P. ; [weitere]

Bingley : Emerald

Microelectronics international 19 (2002), S. 19-22

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ISSN: 1356-5362

Quelle: Emerald Fulltext Archive Database 1994-2005

Thema: Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: Developments in neutron detection technology during the past three years are reviewed with special emphasis on application to safety, security, or industrial development.An investigation about the possibility of using N-channel power MOSFET (metal oxide semiconductor field effect transistor) as a high-energy neutron sensitive detector is presented here. An empirical expression for neutron fluence detection is derived from the relation between neutron fluence and the evolution of the transistor current measured in the saturation region. This expression is valid for neutron fluence in the range 5×109–1×1014?n?cm-2.