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  • 1
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 107 (1997), S. 6448-6459 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The dynamics of dissociation and negative ion formation have been investigated for the hyperthermal energy scattering of state-selected OCS+(X 2Πx, υ1, υ2, υ3) on Ag(111). Experiments reveal the effect that collision energy and internal energy have on the formation of scattered ionic products. An analysis of the appearance threshold and fragment velocity distribution for each scattered product channel [S−(2P), O−(2P), and SO−(X 2Π)] suggests that three distinct fragmentation mechanisms compete. Prompt impulsive dissociation of neutralized OCS+(X 2Π), followed by electron attachment to the nascent O fragment, is responsible for O−(2P) emergence. The production of SO−(X 2Π) relies on a collisionally activated distortion of OCS, forcing the O and S atoms close together while ejecting the central carbon atom. Finally, a comparison between the scattering of state-selected OCS+(X 2Πx, υ1, υ2, υ3) and S+(4S) on Ag(111) provides strong evidence that dissociative neutralization of OCS+(X 2Πx, υ1, υ2, υ3) leads to S−(2P) fragments. A discussion of time scales for the various dissociation mechanisms is presented. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 8330-8335 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The possibility is addressed of improving the electromigration resistance of Al and Al–Cu thin-film conductors with "quasi-bamboo'' structures by post-pattern anneals that decrease the maximum polygranular segment length. Pure Al, Al–2Cu, and Al–2Cu–1Si lines were patterned and annealed at temperatures high enough to stimulate grain growth. Appropriate anneals led to predominantly bamboo structures with short polygranular segments. These grain structures had a high median time to failure with a relatively low deviation of the time to failure. Metallographic analyses showed that polygranular segment length was a dominant factor in determining the failure site. Post-pattern annealing promotes a preferential shortening of the relatively long polygranular segments that cause early failures. However, even after annealing, failure occurred at the longest residual polygranular segments, even when these were significantly shorter than the "Blech length'' under the test conditions. Statistical analysis of the failure of alloy lines revealed a simple exponential relation between the failure time and the longest polygranular segment length within a line, which is functionally identical to that previously found for lines tested in the as-patterned condition.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 102 (1995), S. 4996-5011 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Hyperthermal energy reactions of NO+ with Ag(111) were studied as a function of collision energy and the incident diatom's internuclear-axis direction. Laser photoselection via (1+1') resonance enhanced multiphoton ionization (REMPI) prepared an aligned distribution of NO+(X 1Σ+, Etrans, v=0, J) prior to the molecules impact with the surface. The emergence of scattered O− products was enhanced when NO+ approached the surface with an "end-on'' rather than a "side-on'' orientation. Moreover, the magnitude of the reaction's alignment preference increased with decreasing collision energy. The appearance threshold for O− was approximately 20 eV. Classical trajectory calculations demonstrated that these results are consistent with a collision-induced dissociation mechanism mediated by both vibrational and rotational excitation upon impact. Reorientation of the internuclear axis during the collision drastically affects the simulated dissociation dynamics. No alignment preference for scattered NO− emergence could be discerned from the experiments. As a complement, the angular momentum mechanics are provided to predict the internuclear-axis distribution of ions created via two-photon REMPI. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1471-0528
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Medicine
    Notes: To examine the Down's syndrome screening positive rate among in vitro fertilisation (IVF) pregnancies, we measured second trimester serum marker levels in singleton IVF pregnancies (cases) and in five non–IVF pregnancies (controls) matched to each case for gestational age, age of mother, and duration of storage of the serum sample. There were 151 IVF pregnancies in which alpha fetoprotein, unconjugated oestriol (uE3), free β–human chorionic gonadotrophin (hCG) and total hCG were measured, 104 IVF pregnancies in which free α-hCG was measured, and 39 IVF pregnancies in which inhibin A was measured. Median uE3 levels were 6% lower (P= 0.003), median free β–hCG 9% higher (P= 0.024), and median total hCG 14% higher (P= 0.026) in IVF pregnancies compared with controls. The screen positive rate in the IVF pregnancies (28%) was about twice as high as that in controls (17%). High hCG levels may be explained by progesterone remaining high in IVF pregnancies. The low uE3 levels remain unexplained. In Down's syndrome screening in IVF pregnancies hCG and uE3 values should be adjusted to avoid the high screen positive rate.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Macromolecules 28 (1995), S. 3973-3979 
    ISSN: 1520-5835
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 196-200 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This work reports a statistical analysis of the evolution of polygranular segment lengths during high-temperature annealing of Al(Cu) thin-film interconnects with quasi-bamboo microstructures. To create samples of Al(Cu) lines that could be imaged by transmission electron microscopy without breaking or thinning, the lines were deposited on electron-transparent silicon nitride films (the "silicon nitride window" technique). The microstructures of the lines were studied as a function of annealing time and temperature. In particular, the distribution of polygranular segment lengths was measured. The results show that the longer polyglranular segments are preferentially eliminated during post-pattern annealing. As a consequence, the segment-length distribution narrows monotonically during annealing, and changes in shape. The preferential loss of the longest polygranular segments leads to a dramatic increase in resistance to electromigration failure.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 67 (1995), S. 2901-2903 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: 3 W cw output power has been obtained from aluminum-free, strained-layer double-quantum well (DQW) InGaAs/InGaAsP/InGaP uncoated, 100-μm-wide stripe diode lasers (λ=0.945 μm) grown by low-pressure MOCVD on exact (100) GaAs substrates. The combination of high-band-gap (1.62 eV) InGaAsP confinement layers and the DQW structure provides relatively weak temperature dependence for both the threshold current Ith as well as the external differential quantum efficiency ηd. Furthermore, the series electrical resistance for 100 μm×600 μm stripe-contact devices is as low as 0.12 Ω. As a result, the power conversion efficiency reaches a maximum of 40% at 8×Ith, and decreases to only 33% at the maximum power (i.e., 3 W) at 28×Ith. Low-temperature (12 K) photoluminescence measurements of InGaAs/InGaAsP quantum-well structures exhibit narrow linewidths (〈10 meV) for material grown on exact (100) GaAs substrates, while growths on misoriented substrates exhibit linewidth broadening, as a result of "step bunching.'' Laser structures grown on misoriented substrates exhibit increased temperature sensitivity of both Ith and ηd, compared with structures grown on exact (100) substrates. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 1592-1598 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article employs a one-dimensional diffusion model to study the phenomenon of electromigration-induced edge drift in a finite, Al–Cu thin-film conductor. Edge drift is caused by the accumulation of vacancies at the negative (upstream) terminal of the conductor as Al diffuses with the electrical current. When the Cu content exceeds its solubility limit, grain boundaries are decorated with Al2Cu precipitates, which must be dissolved before significant Al diffusion occurs. Assuming one-dimensional flow in a homogeneous, polygranular film, we compute the rate of growth of the precipitate-free zone at the upstream terminal, and estimate the incubation time for the onset of edge drift. The results predict an incubation time that increases with the grain size and the initial Cu content, and decreases with the square of the current density. The incubation time is inversely proportional to the "electromigration diffusivity", DE=DBCuδZCu*, the product of the grain boundary diffusivity of Cu, the effective grain boundary thickness, and the effective valence of the Cu ion. The results are used to compare a number of prior experimental studies, which are shown (with one exception) to produce consistent values for DE. An analysis of the experimental results suggests that edge drift begins almost as soon as the precipitate-free zone length exceeds the "Blech length" for the line, suggesting that the presence of Al2Cu precipitates in the grain boundaries is essential to retard Al electromigration.
    Type of Medium: Electronic Resource
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  • 9
    ISSN: 1520-5126
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Biochemistry 34 (1995), S. 15523-15531 
    ISSN: 1520-4995
    Source: ACS Legacy Archives
    Topics: Biology , Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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