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  • 1995-1999  (7)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 62 (1996), S. 417-427 
    ISSN: 1432-0630
    Keywords: PACS: 75.70Ak; 75.30Gw; 73.20 ; r
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract.  Nickel allows to study the largest variety of phenomena in the magnetism of UHV ultrathin films. The low critical temperature of ≈630 K for the bulk favors experiments from 0 K to above T c and from one monolayer to infinite thick films. The thickness dependence of T c (d) for the (001) and the (111) orientation is compared. Susceptibility measurements in UHV are presented, and from χmax the film geometry can be deduced. Ferromagnetic resonance measures the second- and fourth-order anisotropy constants. These give a clear understanding of when and how the reorientation transition from the in-plane to the perpendicular orientation occurs and its nature. Magnetic resonance and circular X-ray dichroism measure the spin and orbital parts of the magnetic moment μ, its anisotropy Δμ, and the 3d and 4sp contributions. Finally, we show how a 4 Monolayer (ML) Ni (001) film can be transformed into NiO by controlled oxygen dosage and thermal treatment.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: By combining MCXD experiments with first principles electronic structure calculations, we demonstrate that the orbital contribution to magnetism can be strongly enhanced at surfaces. This effect is illustrated for Co grown on a Cu(100) surface. The MCXD measurements were performed using the SX 700 plane grating monochromators at BESSY. The Co films were evaporated and characterized in situ, for their cleanness, thickness (1.6–50 ML), and structural order. For a film thickness up to 2.2 ML, measurements of the ac MCXD susceptibility response at a fixed photon energy allowed one to measure the critical temperature, Tc, of the films and their critical properties were characterized in situ. For several samples the MCXD response as a function of the x-ray incidence angle was investigated as well. This allows one to quantify and correct saturation effects that can occur in the measurements. Data were taken in a temperature range between 40 and 350 K, and for many samples measurements were performed at several reduced temperatures, T/Tc. The first layer of Co on the Cu(100) surface shows an enhanced orbital moment, in contrast to the subsequent layers where the orbital moment is bulklike. The lowering of the symmetry, the enhanced spin moment, and the increased value of the density of states at the Fermi level are factors that combine to give the observed enhancements. © 1996 American Institute of Physics. [S0021-8979(96)679608-0]
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report magnetic extended x-ray absorption fine structure (EXAFS) measurements on 30 monolayer Fe and Co films on Cu(001) substrates at L3,2 edges. For 3d transition metals, the magnetic EXAFS at the L edges is of great interest since it probes final d states which mainly contribute to magnetism. Magnetic EXAFS oscillations were detected up to 500 eV above the edge corresponding to 11.5 Å−1 in k space. Over such a large range, the long wavelength wiggles from the Fe and Co nearest neighbor backscattering and previously observed fast oscillations are clearly seen. It is shown that without using any deconvolution procedure a meaningful analysis can be performed despite an interference of L3 and L2 edges. In the case of Fe, experimental data are compared with multiple-scattering calculations. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5038-5043 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The pseudomorphic growth of ultrathin films produces artificial structures, and with it anomalously large magnetic anisotropy energies (MAEs). Second- and fourth-order MAEs K2,K4 can be measured and analyzed. To understand the continuous (steplike) rotation of M in a spin reorientation transition (SRT), K4〈0(K4〉0) is necessary. By means of ferromagnetic resonance measurements we show that for fct Ni/Cu(001) the SRT is of second order. It is important to measure the "surface" and "volume" contribution for all MAE contributions K2,K4,... as a function of temperature. These results are compared with T=0 K first principle electronic structure calculations. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 6 (1999), S. 699-700 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 6 (1999), S. 696-698 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 62 (1996), S. 417-427 
    ISSN: 1432-0630
    Keywords: 75.70Ak ; 75.30Gw ; 73.20-r
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract Nickel allows to study the largest variety of phenomena in the magnetism of UHV ultrathin films. The low critical temperature of ≈ 630 K for the bulk favors experiments from 0 K to aboveT c and from one monolayer to infinite thick films. The thickness dependence ofT c (d) for the (001) and the (111) orientation is compared. Susceptibility measurements in UHV are presented, and from χmax the film geometry can be deduced. Ferromagnetic resonance measures the second- and fourth-order anisotropy constants. These give a clear understanding of when and how the reorientation transition from the in-plane to the perpendicular orientation occurs and its nature. Magnetic resonance and circular X-ray dichroism measure the spin and orbital parts of the magnetic moment µ, its anisotropy Δµ, and the 3d and 4sp contributions. Finally, we show how a 4 Monolayer (ML) Ni(001) film can be transformed into NiO by controlled oxygen dosage and thermal treatment.
    Type of Medium: Electronic Resource
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
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