ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We present high-resolution magnetic force microscopy1 (MFM) images of a Co80Cr20 thin film. Clearly a stripe domain structure with a domain width of 220 nm is observed, the highest resolution of a periodic magnetic structure measured by MFM to this date, and magnetic fine structure of typically 50 nm width and more than 200 nm length by measuring forces as small as 0.1 nN. The micromagnetic structure is compared to the morphology of the sample, which consists of vertical columns with an average diameter of 40 nm×60 nm, and to theoretical simulations of force traces, which are in reasonable agreement with experiment.2 These results are compared to the 10-nm resolution obtained on rapidly quenched FeNdB, a nonperiodic magnetic structure.3 If an effective tip domain structure is assumed, reasonable agreement of theoretical simulations and experiment is achieved. The sample morphology as determined by atomic force microscopy is very flat on a 500-nm lateral scale. In contrast, scanning-tunneling-microscope measurements in ultrahigh vacuum show a grain structure after removing the nonconducting surface layer by Ar-ion etching. The experimental resolutions are compared to theoretical expectations4; possibilities of improvement are discussed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.346023
Permalink
