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  • 1
    Electronic Resource
    Electronic Resource
    Bradford : Emerald
    International journal of numerical methods for heat & fluid flow 12 (2002), S. 1009-1031 
    ISSN: 0961-5539
    Source: Emerald Fulltext Archive Database 1994-2005
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Notes: A control-volume based method for the numerical calculation of axisymmetric incompressible fluid flow and heat transfer is presented. The proposed method extends the staggered grid approach to unstructured triangular meshes. The velocities are stored at the vertices and the edges of a triangle, pressure and temperature are stored at the vertices. Accordingly, velocities are interpolated in a quadratic way, pressure and temperature linearly. The accuracy of the proposed method is examined for a number of different testproblems. Compared to a linear interpolation scheme implemented in the same code, more accurate solutions and smaller computation times are obtained for the proposed quadratic scheme. The method was designed for and is about to be applied to the numerical simulation of crystal growth.
    Type of Medium: Electronic Resource
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  • 2
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of hydrogenated amorphous carbon for magnetic data storage media have been examined by atomic force microscopy. The topography of several coatings has been imaged with a lateral resolution of a few nanometers. Histograms of the height distribution and rms values have been calculated to characterize the roughness of the surfaces quantitatively. Variations of these microscopic properties could be related to changes in the macroscopic behavior like friction and wear.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 1437-1441 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic force microscopy (MFM) images of rapidly quenched FeNdB are presented. The magnetic domain structure as observed by MFM consists of elongated, polyhedral-shaped domains imaged by measuring forces smaller than 10−9 N at distances ranging from 20 to more than 200 nm. The domain transition regions, which are quite sharp and well defined, often show a double-peaked structure with a peak-to-peak distance of 10 nm. At force sensor tip-to-sample separations larger than 90 nm only a single peak is observable. It has to be assumed that the relevant effective magnetic volume of the force sensing tip is considerably smaller than the geometric dimensions as determined by scanning electron microscopy in order to understand this 10-nm resolution.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 2920-2925 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have built a low temperature scanning force microscope which is able to measure contact and noncontact forces using the dc modes of force microscopy. We demonstrate the capabilities of our instrument on a magneto-optical disk at room temperature and at 77 K. Using a ferromagnetic thin film tip, the topography and the micromagnetic stray field of the sample is measured using the dc modes of force microscopy. The topographic and magnetic data are precisely correlated. The circular bit structure and the natural domain structure between the homogeneously magnetized bits is clearly visible. A lateral resolution below 100 nm and a force resolution of 10−12 N is reproducibly achieved.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 63 (1992), S. 3900-3904 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Impressed by the high resolution and easy operation of the new generation scanning tunneling microscopes (STMs), we built a pocket-size high-stability atomic force microscope (AFM) with deflection measurement by tunneling. It was our aim to reach high mechanical and thermal stability of the tunnel junction as well as full compatibility with our existing STM system. Our first AFM scanhead, designed for large scan ranges up to 15 μm, stably measured an artificial grid structure on SiO2, reproducibly showing details of less than 1 nm in size. On this well-defined sample we compared constant force with variable deflection measurements.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1432-0711
    Source: Springer Online Journal Archives 1860-2000
    Topics: Medicine
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Springer
    The European physical journal 19 (1991), S. 327-331 
    ISSN: 1434-6079
    Keywords: 61.16.Di ; 68.35.Wn ; 82.70.Rr
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Small Ag and C particles, about 10 nm in diameter, are produced in gas suspension and precipitated on HOPG substrates for STM analysis. The STM pictures showed much smaller particle concentrations than anticipated from parallel TEM studies. The particles appear very flat in STM, not spherical as expected. These effects could be attributed to the nature of interaction between particle and surface, or to the interaction between tip and particle. Many of our experimental results are consistent with particles moving under the influence of the scanning tip.
    Type of Medium: Electronic Resource
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