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  • 1
    Electronic Resource
    Electronic Resource
    Ball Milled ZnO for Varistor Applications (1996)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 235-238 (Oct. 1996), p. 993-0 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/02/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.235-238.993.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    Cryogenic magnetic force microscope (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3782-3787 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe our cryogenic magnetic force microscope, operating between 4.2 and 300 K, in fields of 0–8 T. The system uses a fiber optic interferometer to measure cantilever deflections, permitting the tracking of the resonance frequency through the use of a phase locked loop. Piezoelectric positioners, capable of operation in high magnetic fields, perform in situ tip and fiber approaches. As an effective means of vibration isolation, we suspend the microscope from a soft bellows which attenuates vibrations by more than an order of magnitude. A detailed noise analysis indicates that although the microscope is thermally limited, the system frequency resolution is currently limited by the shot noise of the interferometer. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1290039
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  • 3
    Electronic Resource
    Electronic Resource
    Investigation of hydrogenated amorphous carbon coatings for magnetic data storage media by atomic force microscopy (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1624-1626 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Thin films of hydrogenated amorphous carbon for magnetic data storage media have been examined by atomic force microscopy. The topography of several coatings has been imaged with a lateral resolution of a few nanometers. Histograms of the height distribution and rms values have been calculated to characterize the roughness of the surfaces quantitatively. Variations of these microscopic properties could be related to changes in the macroscopic behavior like friction and wear.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102218
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  • 4
    Electronic Resource
    Electronic Resource
    Theory of magnetoelastic dissipation due to domain wall width oscillation (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 83 (1998), S. 5922-5926 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: This article presents a general treatment of magnetic dissipation due to domain wall width oscillation via magnetostriction in magnetic samples. The domain wall width is modeled as a harmonic oscillator. The parameters governing this oscillator (effective mass, stiffness, damping coefficient and driving force) are derived and expressed in terms of intrinsic magnetic parameters of magnetic materials. The magnetostriction induced damping of wall width oscillations is frictional in nature. An external ac magnetic field serves as a driving force of the oscillator. It is found that the response to the driving force depends very much on the micromagnetic structures of the magnetic domain wall. Different micromagnetic structures lead to different magnetic dissipation for a given external field. Besides giving a quantitative microscopic explanation to magnetic dissipation data measured by magnetic dissipation force microscopy, this theory predicts two new phenomena: one is that there is a minimum driving force for the wall width to oscillate and the other is a new resonance phenomenon, domain wall width resonance. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.367456
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  • 5
    Electronic Resource
    Electronic Resource
    Magnetic dissipation imaging (abstract) : The 41st annual conference on magnetism and magnetic materials (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 81 (1997), S. 5024-5024 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the first direct measurement of local magnetic dissipation by magnetic force microscopy (MFM). A variation in dissipation of less than 10−17 W can be observed. This allows the determination of the strength of pinning sites and the variation in domain wall dampening on a sub-100 nm scale. We use a standard thin film coated Si3N4 MFM force sensor vibrated exactly at resonance. When close to the sample, the magnetic tip exerts a highly localized alternating magnetic field. Magnetic energy dissipation in the sample leads to dampening of the cantilever oscillation. The frequency, phase, and amplitude of the cantilever oscillation is measured with a dedicated phase-lock-loop circuit. The change in driving signal amplitude is directly proportional to the energy dissipation if the drive signal phase is constant. Constant force gradient and dissipation images are acquired simultaneously. By changing the tip–sample spacing, the magnitude of the tip magnetic field influencing the sample can systematically be varied. We demonstrate the potential of this technique by imaging local variations of dissipation in 4 nm thin sputtered Co films with Hc=178 Oe and in 30 nm Permalloy samples with Hc=2 Oe. In both cases a variation on a sub-100 nm scale with strong correlations between the simultaneously measured domain structure and the dissipation images is observed. As expected, dissipation is strongly dependent on the magnitude of the tip field. We also observe that the magnitude of the dissipation depends strongly on the sign of the magnetic interaction. The dissipation observed at Néel walls with attractive tip–sample interaction is larger than the dissipation at repulsive walls. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.364497
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  • 6
    Electronic Resource
    Electronic Resource
    Can magnetic-force microscopy determine micromagnetic structures? (1994)
    Oxford, UK : Blackwell Publishing Ltd
    Geophysical journal international 116 (1994), S. 0 
    Details
    ISSN: 1365-246X
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Geosciences
    Notes: The applicability of magnetic-force microscopy (MFM) to determine micromagnetic structures is considered with respect to the work of Williams et al. (1992), who claim to have determined the domain-wall structure in magnetite. The analysis and interpretation of MFM data are recapitulated and the potential pitfalls are illustrated by comparing the results of the MFM experiments with the magnetization distribution obtained by spin-polarized scanning electron microscopy on the same sample. It is concluded that the micromagnetic interpretation of MFM data is extremely difficult and currently not feasible.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1111/j.1365-246X.1994.tb01812.x
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  • 7
    Electronic Resource
    Electronic Resource
    Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 668-673 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum (〈10−3 Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional "slope detection,'' the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q∼50 000) versus slope detection in air (Q∼100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin-film CoPtCr magnetic disk. In the future, the increased sensitivity offered by this technique should extend the range of problems accessible by force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347347
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  • 8
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy with batch-fabricated force sensors : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5883-5885 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this paper the properties of force sensors suitable for magnetic force microscopy (MFM) made by coating silicon microcantilevers with various thin magnetic films are analyzed. These MFM force sensors are batch fabricated and their magnetic properties controlled by choosing appropriate coatings. Theoretical calculations show that thin-film MFM tips have a significantly reduced stray field, a good signal-to-noise ratio, and yield improved resolution when compared to etched wire tips. The sample perturbation due to the tip stray field is small, allowing the imaging of low-coercivity samples such as Permalloy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347856
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  • 9
    Electronic Resource
    Electronic Resource
    High-resolution magnetic force microscopy (abstract) (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 5953-5953 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present high-resolution magnetic force microscopy1 (MFM) images of a Co80Cr20 thin film. Clearly a stripe domain structure with a domain width of 220 nm is observed, the highest resolution of a periodic magnetic structure measured by MFM to this date, and magnetic fine structure of typically 50 nm width and more than 200 nm length by measuring forces as small as 0.1 nN. The micromagnetic structure is compared to the morphology of the sample, which consists of vertical columns with an average diameter of 40 nm×60 nm, and to theoretical simulations of force traces, which are in reasonable agreement with experiment.2 These results are compared to the 10-nm resolution obtained on rapidly quenched FeNdB, a nonperiodic magnetic structure.3 If an effective tip domain structure is assumed, reasonable agreement of theoretical simulations and experiment is achieved. The sample morphology as determined by atomic force microscopy is very flat on a 500-nm lateral scale. In contrast, scanning-tunneling-microscope measurements in ultrahigh vacuum show a grain structure after removing the nonconducting surface layer by Ar-ion etching. The experimental resolutions are compared to theoretical expectations4; possibilities of improvement are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346023
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  • 10
    Electronic Resource
    Electronic Resource
    10-nm resolution by magnetic force microscopy on FeNdB (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 1437-1441 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic force microscopy (MFM) images of rapidly quenched FeNdB are presented. The magnetic domain structure as observed by MFM consists of elongated, polyhedral-shaped domains imaged by measuring forces smaller than 10−9 N at distances ranging from 20 to more than 200 nm. The domain transition regions, which are quite sharp and well defined, often show a double-peaked structure with a peak-to-peak distance of 10 nm. At force sensor tip-to-sample separations larger than 90 nm only a single peak is observable. It has to be assumed that the relevant effective magnetic volume of the force sensing tip is considerably smaller than the geometric dimensions as determined by scanning electron microscopy in order to understand this 10-nm resolution.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.345675
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