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  • 1
    Electronic Resource
    Electronic Resource
    Low-temperature atomic force microscopy (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 833-835 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A low-temperature atomic force microscope (LTAFM) has been constructed which is capable of resolving atomic scale features both in air at room temperature and immersed in liquid helium at 4.2 K. The instrument is of a rigid compact design, using microfabricated force-sensing cantilevers, and can easily be adapted for operation as a scanning tunneling microscope. Initial results have demonstrated that the LTAFM can image the atomic surface structure of 2H–MoS2 at 4.2 K and room temperature. Design criteria and applications of the LTAFM are discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139788
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    Paper (German National Licenses)
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  • 2
    Electronic Resource
    Electronic Resource
    Forces in atomic force microscopy in air and water (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 54 (1989), S. 2651-2653 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new atomic force microscope, which combines a microfabricated cantilever with an optical lever detection system, now makes it possible to measure the absolute force applied by a tip on a surface. This absolute force has been measured as a function of distance (=position of the surface) in air and water over a range of 600 nm. In the absolute force versus distance curves there are two transitions from touching the surface to a total release in air caused by van der Waals interaction and surface tension. One transition is due to lifting off the surface; the other is due to lifting out of an adsorbed layer on the surface. In water there is just one transition due to lifting off the surface. There is also a transition in air and water when the totally released tip is pulled down to touch the surface as the surface and tip are brought together. Based on the force versus distance curves, we propose a procedure to set the lowest possible imaging force. It can now be as low as 10−9 N or less in water and 10−7 N in air.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.101024
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    Paper (German National Licenses)
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  • 3
    Electronic Resource
    Electronic Resource
    Nanometer-scale hole formation on graphite using a scanning tunneling microscope (1989)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 55 (1989), S. 1727-1729 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present a reproducible technique for forming holes on a graphite surface with a scanning tunneling microscope. The holes have an average diameter of 40 A(ring) (20 A(ring) minimum) with an average resolvable spacing of 60 A(ring). Holes are produced by applying a short voltage pulse (3–8 V, 10–100 μs) across the tunneling gap which removes one or more layers of graphite in a small region directly below the tip. Arrays of hundreds of holes have been formed with yields as high as 99.6%. The writing process has a higher success rate in air or in the presence of water vapor. This suggests that the physical mechanism is a chemical process.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102201
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    Paper (German National Licenses)
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  • 4
    Electronic Resource
    Electronic Resource
    Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 668-673 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A new frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more. Increased sensitivity is made possible by operating in a moderate vacuum (〈10−3 Torr), which increases the Q of the vibrating cantilever. In the FM technique, the cantilever serves as the frequency determining element of an oscillator. Force gradients acting on the cantilever cause instantaneous frequency modulation of the oscillator output, which is demodulated with a FM detector. Unlike conventional "slope detection,'' the FM technique offers increased sensitivity through increased Q without restricting system bandwidth. Experimental comparisons of FM detection in vacuum (Q∼50 000) versus slope detection in air (Q∼100) demonstrated an improvement of more than 10 times in sensitivity for a fixed bandwidth. This improvement is evident in images of magnetic transitions on a thin-film CoPtCr magnetic disk. In the future, the increased sensitivity offered by this technique should extend the range of problems accessible by force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347347
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    Paper (German National Licenses)
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  • 5
    Electronic Resource
    Electronic Resource
    Imaging and modification of polymers by scanning tunneling and atomic force microscopy (1988)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 64 (1988), S. 1178-1184 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Direct imaging of ultrathin organic films on solid surfaces is important for a variety of reasons; in particular, the use of such films as ultrathin resists for nanometer scale fabrication and information recording requires that we understand their microstrucure. We have used the Langmuir–Blodgett technique to prepare monolayer and submonolayer films of poly(octadecylacrylate) (PODA) and poly(methylmethacrylate) (PMMA) on graphite substrates. Atomic scale images obtained with the scanning tunneling microscope (STM) and the atomic force microscope of the PODA films showed a variety of structures, including isolated narrow fibrils, parallel groups of fibrils, and an ordered structure consistent with the side chain crystallization expected with that material. The fibrils observed are interpreted as individual polymer chains or small bundles of parallel chains. Images of the PMMA samples show no ordered regions. By applying voltage pulses on the STM tip, we were able to locally modify and apparently cut through the PODA fibrils.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.341881
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    Paper (German National Licenses)
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  • 6
    Electronic Resource
    Electronic Resource
    Atomic resolution imaging of a nonconductor by atomic force microscopy (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 2599-2602 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have demonstrated the capability of the atomic force microscope to image the surface of an electrically insulating solid with atomic resolution. Images of highly oriented pyrolytic boron nitride taken in air show atomic corrugations with a lateral resolution better than 3 A(ring). Low-noise images of graphite and molybdenum disulfide are also presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.339435
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    Paper (German National Licenses)
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  • 7
    Electronic Resource
    Electronic Resource
    Observation of tilt boundaries in graphite by scanning tunneling microscopy and associated multiple tip effects (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 362-364 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Tilt boundaries have been observed on the (0001) surface of graphite by scanning tunneling microscopy (STM). Rotation angles about the c axis of 6.5°, 8°, and 19° were found, indicating no preferential orientation of grains in the basal plane of graphite. The grain boundary region between crystallites appears disordered with a width varying between 10 and 100 A(ring). Moiré patterns are observed near grain boundaries when multiple tips scanning over different grains contribute to the image simultaneously. Such images support the theory that multiple isolated tips, occasionally hundreds of angstroms apart, can contribute to STM images.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99465
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    Paper (German National Licenses)
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