ISSN:
1089-7674
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Experimental evidence suggests that unabsorbed wave energy in ion cyclotron range of frequency fast wave (FW) experiments can result in deleterious edge interactions. A model describing the formation of far field sheaths due to FW interaction with material surfaces is presented. Near conductors that do not conform to flux surfaces, an incoming FW causes the generation of a slow wave (SW) component. The E(parallel) of the SW drives an RF sheath, in a manner similar to what has been previously discussed for antenna (near field) sheaths. To assess the importance of the proposed mechanism, a heuristic scaling model of the resultant sheath voltage V is developed and compared with a numerical code. The model illustrates the important dependencies of V on the single pass absorption, edge density, FW frequency, FW cutoff location, and limiter/wall geometries and yields qualitative agreement with the experimental observations.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.870529
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